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边界扫描测试的数学描述模型
引用本文:胡政,温熙森.边界扫描测试的数学描述模型[J].国防科技大学学报,1999,21(5):83-87.
作者姓名:胡政  温熙森
作者单位:国防科技大学机械电子工程与仪器系!长沙410073
摘    要:IEEE1149.1边界扫描机制是一种新型的VLSI电路测试及可测试性设计的有效方法,为了高效地应用边界扫描机制对电路系统进行测试,必须对其所涉及的理论方法进行深入探讨。本文应用布尔矩阵理论建立起边界扫描测试的数学描述模型,并基于所建立的模型导出了边界扫描测试中的故障检测条件和故障隔离条件。为边界扫描测试生成算法的深入研究奠定了理论基础。

关 键 词:可测试性设计  边界扫描  布尔矩阵  数学模型  测试生成
收稿时间:3/9/1999 12:00:00 AM

Mathematical Model of Boundary Scan Test
Hu Zheng and Wen Xisen.Mathematical Model of Boundary Scan Test[J].Journal of National University of Defense Technology,1999,21(5):83-87.
Authors:Hu Zheng and Wen Xisen
Affiliation:Department of Mechatronics and Instrumentation, NUDT, Changsha, 410073;Department of Mechatronics and Instrumentation, NUDT, Changsha, 410073
Abstract:Boundary Scan Technique (BST) is a new and effective way of test and design for testability for VLSI circuits. In order to use BST more efficiently, it is necessary to study the basic theory of boundary scan test thoroughly and precisely. In this paper, A mathematical model of boundary scan test process is set up based on Boolean Matrix theory. Then, by applying the model established, two boundary scan test generation principles are presented. The first one gives the sufficient condition for fault detection in boundary scan test. The second gives the sufficient condition for fault isolation and diagnosis in boundary scan test. The mathematical model and its deduction constitute the theoretical basis of boundary scan test, which can be used in developing test generation algorithms with better property.
Keywords:design  for  testability  boundary scan  Boolean matrix  mathematical model  test generation
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