Estimating failure time distribution and its parameters based on intermediate data from a Wiener degradation model

Instead of measuring a Wiener degradation or performance process at predetermined time points to track degradation or performance of a product for estimating its lifetime, we propose to obtain the first‐passage times of the process over certain nonfailure thresholds. Based on only these intermediate data, we obtain the uniformly minimum variance unbiased estimator and uniformly most accurate confidence interval for the mean lifetime. For estimating the lifetime distribution function, we propose a modified maximum likelihood estimator and a new estimator and prove that, by increasing the sample size of the intermediate data, these estimators and the above‐mentioned estimator of the mean lifetime can achieve the same levels of accuracy as the estimators assuming one has failure times. Thus, our method of using only intermediate data is useful for highly reliable products when their failure times are difficult to obtain. Furthermore, we show that the proposed new estimator of the lifetime distribution function is more accurate than the standard and modified maximum likelihood estimators. We also obtain approximate confidence intervals for the lifetime distribution function and its percentiles. Finally, we use light‐emitting diodes as an example to illustrate our method and demonstrate how to validate the Wiener assumption during the testing. © 2008 Wiley Periodicals, Inc. Naval Research Logistics, 2008     

Optimum step‐stress accelerated life test plans for log‐location‐scale distributions

This article presents new tools and methods for finding optimum step‐stress accelerated life test plans. First, we present an approach to calculate the large‐sample approximate variance of the maximum likelihood estimator of a quantile of the failure time distribution at use conditions from a step‐stress accelerated life test. The approach allows for multistep stress changes and censoring for general log‐location‐scale distributions based on a cumulative exposure model. As an application of this approach, the optimum variance is studied as a function of shape parameter for both Weibull and lognormal distributions. Graphical comparisons among test plans using step‐up, step‐down, and constant‐stress patterns are also presented. The results show that depending on the values of the model parameters and quantile of interest, each of the three test plans can be preferable in terms of optimum variance. © 2008 Wiley Periodicals, Inc. Naval Research Logistics, 2008     

一种改进的事件驱动系统框架

在给出事件驱动系统安全漏洞的基础上,指出了产生漏洞的根本原因是:系统忽视了输入系统的事件序列之间存在的相关性;系统无条件信任任何事件源产生的事件.针对这两个原因,相应提出了事件序列形式安全分析模型及基于事件源的可信度评估模型,依据这两个模型,构建了一种改进的事件驱动系统框架.     

基于循环子空间理论的线性系统测试矩阵优化

研究了线性定常系统在循环指数大于1(即其约当标准形不同的约当块有重根)的情况下测试矩阵的优化方法.以循环子空间相关定理的证明为基础,根据根向量链的相关特性,得到了测试向量的线性和与系统观测性的直接关系,给出了在保证系统可观测性的同时,使得测试代价最小的测试矩阵优化方法.算例表明,提出的方法简单直观,对配置测试向量具有良好的工程价值.     

一种改进方位向非线性CS大斜视角SAR成像算法

大斜视角SAR成像时存在严重的距离走动现象,慢时域的距离走动校正在解决这一问题同时导致了聚焦深度问题.分析了二维频域解耦合后残余相位误差以及时域走动校正后的多普勒调频率误差,提出一种改进的方位向非线性CS算法,校正了三次以上距离迁徙带来的相位误差,同时采用改进非线性CS扰动方程补偿了随方位偏移量线性变化的调频率误差.仿真结果表明,改进算法的大斜视角大场景成像性能优于传统的高分辨大斜视角成像算法.     

相位非线性畸变对GPS伪距测量的影响

基于直接序列扩频体制的伪距测量在卫星导航、雷达、航天测控、深空探测等领域获得了广泛应用.射频链路、电缆多径等引入的相位非线性畸变会对扩频信号的传输时延产生影响,进而影响延迟锁定环(DLL)的伪距测量结果.传统群时延的定义难以描述一定带宽内的相位畸变,也难以与扩频信号时延建立对应关系.在对相频曲线进行Taylor展开的基础上给出了群时延的新定义,利用零阶群时延、线性群时延和抛物线群时延等来描述相位畸变,并定量研究各阶群时延对DLL伪距测量的影响.所得结论表明抛物线(二阶)群时延对伪距测量的影响最大.     

捷联惯导系统快速自对准误差模型的建立

通过对惯性制导系统两个基本方程的研究,求出了各状态矢量在各坐标系下的微分方程,然后以ψ角法所确立的平台为基准,分别推导得出惯性制导系统各主要状态的微分方程,从而建立了捷联惯性制导系统的误差模型.最后根据静基座捷联惯导系统初始对准的特点对其进行简化,得到了静基座捷联惯导系统快速自对准的误差模型.     

坦克火控系统自动跟踪功能关键技术

结合现代军事发展,分析了现代坦克火控系统发展自动跟踪技术的必要性;根据我军现装备的坦克火控系统所具有的自动跟踪功能,分析了自动跟踪的相关技术,电视跟踪技术的原理,图像匹配法的涵义;系统介绍了电视跟踪中图像匹配法识别和跟踪目标,介绍了目标自动跟踪系统对目标识别和判定的一种具体方法.     

关于ADC法评估C~4ISR系统效能中的可靠性

针对运用ADC法评估防空C4ISR系统效能中,可靠性是影响系统效能的重要因素,对C4ISR系统的可靠性进行研究,重点分析了软件及通信网可靠性的估算公式,并在此基础上建立可用性A和可信性D数学模型.最后,通过实例分析证明了可靠性对系统效能评估的重要影响.     

地面战场侦察传感器系统的发展状况及技术分析

主要介绍了国内外地面战场侦察传感器系统的主要用途、基本组成和分类,对其未来发展趋势进行了分析,根据我军地面战场侦察传感器系统的技术现状提出了需要解决的关键问题。