| 时序电路测试中敏化路径选择研究 |
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| 引用本文： | 王仲,宫云战,康葳.时序电路测试中敏化路径选择研究[J].装甲兵工程学院学报,1998(3). |
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| 作者姓名： | 王仲 宫云战 康葳 |
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| 作者单位： | 装甲兵工程学院计算机教研室!北京100072 |
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| 摘 要： | 时序电路测试产生过程中,在进行敏化路径选择时会遇到失败问题.本文针对迭代组合阵列模型测试中产生的这些问题进行了有益的探讨,并提出了改进的时序电路测试产生算法,使之更加完善.
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| 关 键 词： | 时序电路测试 迭代组合阵列 敏化路径 |
A Sensitization Path Selecting Problem in Sequential Circuits Testing Generation |
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| Wang Zhong Gong Yunzhan Kang Wei.A Sensitization Path Selecting Problem in Sequential Circuits Testing Generation[J].Journal of Armored Force Engineering Institute,1998(3). |
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| Authors: | Wang Zhong Gong Yunzhan Kang Wei |
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| Institution: | Wang Zhong Gong Yunzhan Kang Wei |
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| Abstract: | Sequential circuit testing generation with iterative array model will face the problem of timing in iterative array model when it uses combinational circuits testing generation algorithms. The problem is timing in iterative array model. This paper discusses this problem, and gives an improved algorithm for sequential circuit testing generation. |
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| Keywords: | sequential circuits testing generation iterative array sensitization path |
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