| Abstract: | The subject of this paper is the utilization of the “infant mortality” or decreasing failure rate effect to improve the reliability of repairable devices. Decreasing failure rate implies the possibility that devices which exhibit it can be improved by “burn-in testing” of each unit. Such a test serves to accumulate operating time while shielded from the full costs and consequences of failure. A general formulation of the burn-in test decision for repairable devices is presented and some special cases are solved. A class of models, indexed by the degree of partial replacement present in the repair process, is considered and numerical results for the optimal policy are given for several members of that class. A comparison of those results reveals the profitability of testing increases with the complexity of the repairable device. |
