首页 | 本学科首页   官方微博 | 高级检索  
   检索      

论四值动态代价分析方法
引用本文:曾芷德,盛运焕.论四值动态代价分析方法[J].国防科技大学学报,1988,10(1):1-7.
作者姓名:曾芷德  盛运焕
作者单位:国防科技大学计算机系 (曾芷德),国防科技大学计算机系(盛运焕)
摘    要:本文在文献10]的基础上,着重论述了四值动态代价分析方法引进故障电路代价FC和故障可测度T的新概念的必要性。并从预报数字电路中的不可测故障、提高故障敏化效率和选取引线置值模式的效率三方面,对四值分析与文献1]的二值分析进行了详细比较,结论是:四值分析定义的可测度比二值更接近数字电路实际,加速测试生成的效果更好。实践表明,四值分析用于自动测试生成系统ATGS,所节省的计算机CPU时间为二值分析的3倍。

关 键 词:故障电路代价  故障可测度  四值动态代价分析
收稿时间:1987/6/1 0:00:00

On the Four Values Dynamic Costs Analysis Method
Zeng Zhide and Sheng Yunhuan.On the Four Values Dynamic Costs Analysis Method[J].Journal of National University of Defense Technology,1988,10(1):1-7.
Authors:Zeng Zhide and Sheng Yunhuan
Institution:Zeng Zhide;Sheng Yunhuan
Abstract:The paper discusses mainly the necessity that new concepts on costs Fcin faulty circuit and measures T of faulty testability are introduced in thefour values dynamic costs analysis method, based on the literature 10].And comparing the four Values analysis with the two values analysis ofliterature1] comes from the following three aspects: faulties that can't bedetected are predicted, efficiency selecting patterns of faulty sensitizationand assigning line Values, we come to the conclu sion that testabilitymeasures defined in the four values analysis are realisticer than the twovalues in an aspects near real digital circuits and better in an effects forspeeding test generation. In practice has been indicated that when the fourvalues analysis is applied to automatic test generation system ATGS,computer CPU time economized equals three times of the two values.
Keywords:Cost in fault Circuit  Measure of fault tesability  Four values dy namic cost analysis
本文献已被 CNKI 等数据库收录!
点击此处可从《国防科技大学学报》浏览原始摘要信息
点击此处可从《国防科技大学学报》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号