Optimal Bayesian single-sampling attribute plans with modified beta prior distribution

In this article we study the properties of the optimal Bayesian single-sampling plans when the prior distribution of the lot fraction defective is modified Beta, which has been found useful in the analysis of inspection schemes for complex production systems. These properties are used to devise an improved and more efficient algorithm for the determination of the optimal sampling plans. Numerical examples are presented to illustrate the potential computational savings of the algorithm.