| NICALON(SiC)纤维增强铝预制丝透射电镜样品的研制 |
| |
| 引用本文： | 胡君遂,黄大暾,杨志涛,张家春.NICALON(SiC)纤维增强铝预制丝透射电镜样品的研制[J].国防科技大学学报,1989,11(2):107-111. |
| |
| 作者姓名： | 胡君遂 黄大暾 杨志涛 张家春 |
| |
| 作者单位： | 国防科技大学材料科学与应用化学系
(胡君遂，黄大暾，杨志涛)，国防科技大学材料科学与应用化学系(张家春) |
| |
| 摘 要： | 文中研究了用离子减薄法制备NICALON(SiC)/A1预制丝的透射电镜(TEM)样品。结果表明:用离子减薄法制备含有性质非常不同的组元(如碳化硅-铝复合材料)TEM样品是一种方便、有效的方法。运用TEM初步分析了所制出的预制丝样品。
|
| 关 键 词： | 复合材料 金属基复合材料 碳化硅-铝 TEM样品 离子减薄 |
| 收稿时间： | 1988/4/5 0:00:00 |
Development of the Transmission Electron Microscope Sample of NICALON(SiC)/Al Preformed Wires |
| |
| Hu Junsui,Huang Datun,Yang Zhitao and Zhang Jiachun.Development of the Transmission Electron Microscope Sample of NICALON(SiC)/Al Preformed Wires[J].Journal of National University of Defense Technology,1989,11(2):107-111. |
| |
| Authors: | Hu Junsui Huang Datun Yang Zhitao and Zhang Jiachun |
| |
| Institution: | Hu Junsui;Huang Datun;Yang Zhitao;Zhang Jiachun |
| |
| Abstract: | In this paper, the preparation of the Transmission Electron Microscope(TEM) sample of NICALON (SiC)/Al preformed wires has been studied bymeans of Argon Ion Thinning technique. The result has shown that it is aconvienient and effective method to prepare the TEM sample which containsthe components with very different properties, such as the compostes ofsilicon carbide-aluminium. The sample of the preformed wires fabricated bythe AIT method has preliminary been analyzed with the TEM. |
| |
| Keywords: | composite material metal matrix composites silicon carbide-aluminium TEM sample Ion-Thinning |
| 本文献已被 CNKI 等数据库收录！ |
| 点击此处可从《国防科技大学学报》浏览原始摘要信息 |
| 点击此处可从《国防科技大学学报》下载免费的PDF全文 |
