步进加速退化试验及其在电子产品可靠性评估中的应用

为快速评估具有高可靠、长寿命特点的电子产品的可靠性，提出了使用步进加速退化试验技术的方法。文中首先给出了步进加速退化的试验方法及基本假设，然后给出了步进退化数据向恒加退化数据的折算方法，在此基础上提出了基于伪失效寿命的步进加速退化可靠性评估算法，最后利用试验数据对该方法进行了验证。该方法与恒加退化试验相比，在保持样本量不变的基础上，可以极大地缩短试验时间，因此，具有更高的效费比。

Research on step-up-stress Accelerated Degradation Testing Method and Application in Reliability Assessment

In order to evaluate the reliability guidelines for electronic equipment with hi long life quickly, this paper presents the method of step-up-stress accelerated degrada gh reliability and tion testing. First step-up-stress accelerated degradation testing and the basic assumptions are expatiated in detail, and then data conversion method from step-up-stress degradation data to constant stress degradation data is studied. On this basis, step-up-stress accelerated degradation reliability assessment arithmetic based on pseudo- failure lifetime is proposed and a numerical example is given to illustrate the method. Compared with con- stant degradation testing, step-up-stress accelerated degradation testing can decrease testing time to a great extant while keeping invariable the sample size, so it has a higher cost-effective ratio.