首页 | 本学科首页   官方微博 | 高级检索  
   检索      

基于维纳过程金属化膜电容器的剩余寿命预测
引用本文:王小林,程志君,郭波.基于维纳过程金属化膜电容器的剩余寿命预测[J].国防科技大学学报,2011,33(4):146-151.
作者姓名:王小林  程志君  郭波
作者单位:国防科技大学信息系统与管理学院,湖南长沙,410073
基金项目:国家自然科学基金资助项目(60904002)
摘    要:金属化膜电容器是惯性约束聚变激光装置能源系统最重要的元器件,对个体电容器的剩余寿命进行有效的预测对整个装置的可靠性水平有着重要的影响.为有效地预测个体电容器的剩余寿命,提出了融合单个电容器性能退化数据与先验性能退化数据信息的预测方法.采用Wiener过程对其性能退化过程进行建模,并根据先验退化数据信息构造参数的先验分布...

关 键 词:金属化膜电容器  维纳过程  贝叶斯方法  剩余寿命预测
收稿时间:2010/12/31 0:00:00

Residual Life Forecasting of Metallized Film Capacitor Based on Wiener Process
WANG Xiaolin,CHENG Zhijun and GUO Bo.Residual Life Forecasting of Metallized Film Capacitor Based on Wiener Process[J].Journal of National University of Defense Technology,2011,33(4):146-151.
Authors:WANG Xiaolin  CHENG Zhijun and GUO Bo
Institution:WANG Xiao-lin,CHENG Zhi-jun,GUO Bo(College of Information System and Management,National Univ.of Defense Technology,Changsha 410073,China)
Abstract:The metallized film capacitor is one of the most important components of the inertial confinement fusion(ICF) facility.The effective residual life forecasting of capacitors affects the reliability of the whole facility.In order to forecast the residual life of a single capacitor effectively,a method which fuses prior degradation information and its own degradation data was presented.Firstly,the capacitor's degradation process was modeled with Wiener process,whose parameter's prior distribution was establish...
Keywords:metallized film capacitor  wiener process  bayes method  residual life forecasting  
本文献已被 CNKI 万方数据 等数据库收录!
点击此处可从《国防科技大学学报》浏览原始摘要信息
点击此处可从《国防科技大学学报》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号