| Abstract: | MIL-STD-781 specifies reliability acceptance test procedures based on both fixed-length tests and probability ratio sequential tests. The assumption underlying MIL-STD-781 is a constant mean time between failures (MTBF) and typical practice applies MIL-STD-781 to electrical, electronic, and mechanical equipment. This article discusses some of the difficulties that have prompted the C and D revisions of MIL-STD-781. In addition, it discusses the relationship of MIL-STD-781 with MIL-STD-1635(EC) which deals with reliability growth testing. The article concludes with a discussion of needed research in reliability growth testing, in support of MIL-STD-781, and in the area of stress and its impact of MTBF. |
