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A general model of heterogeneous system lifetimes and conditions for system burn‐in
Authors:Kyungmee O Kim  Way Kuo
Abstract:Burn‐in is a technique to enhance reliability by eliminating weak items from a population of items having heterogeneous lifetimes. System burn‐in can improve system reliability, but the conditions for system burn‐in to be performed after component burn‐in remain a little understood mathematical challenge. To derive such conditions, we first introduce a general model of heterogeneous system lifetimes, in which the component burn‐in information and assembly problems are related to the prediction of system burn‐in. Many existing system burn‐in models become special cases and two important results are identified. First, heterogeneous system lifetimes can be understood naturally as a consequence of heterogeneous component lifetimes and heterogeneous assembly quality. Second, system burn‐in is effective if assembly quality variation in the components and connections which are arranged in series is greater than a threshold, where the threshold depends on the system structure and component failure rates. © 2003 Wiley Periodicals, Inc. Naval Research Logistics 50: 364–380, 2003.
Keywords:burn‐in  decreasing failure rate (DFR)  intrinsic failure rate (INFR)  extrinsic failure rate (EXFR)  mixed distribution  IBM model
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