| 时序电路故障可测性分析 |
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| 引用本文： | 王仲,宫云战,康葳.时序电路故障可测性分析[J].装甲兵工程学院学报,1999(3). |
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| 作者姓名： | 王仲 宫云战 康葳 |
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| 作者单位： | 装甲兵工程学院计算机应用教研室 北京100072 |
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| 摘 要： | 对不可测故障进行测试产生是影响时序电路测试产生效率的一个重要因素。文中提出了一种基于简化可控性计算的识别时序电路中不可测故障的算法,运用该算法无须搜索便可识别出时序电路中相当一部分不可测故障。针对ISCAS89电路的实验结果也验证了其有效性。
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| 关 键 词： | 时序电路 可控性 不可测故障 |
Fault Testability Analysis for Sequential Circuit |
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| Wang Zhong Gong Yunzhan Kang Wei.Fault Testability Analysis for Sequential Circuit[J].Journal of Armored Force Engineering Institute,1999(3). |
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| Authors: | Wang Zhong Gong Yunzhan Kang Wei |
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| Institution: | Wang Zhong Gong Yunzhan Kang Wei |
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| Abstract: | Testing generation for faults not testable is an important factor that reduces the efficiency of sequential circuit testing generation. In this paper, we bring forward a new controllability computing method for sequential circuit based on the reduced processing. It can identify a lot of faults not testable in sequential circuit. Experimental results of some ISCAS89 circuits have verified the effectiveness of the method. |
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| Keywords: | sequential circuits controllability fault not testable |
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