Design of accelerated life testing plans under multiple stresses

Accelerated life testing (ALT) using multiple stresses is commonly used in practice to resemble the operating stresses at normal operating conditions and obtain failure observations in a much shorter time. However, to date, there is little research into the theory of planning ALT for reliability estimation with multiple stresses. ALT with multiple stresses can result in a large number of stress‐level combinations which presents a challenge for implementation. In this article, we propose an approach for the design of ALT plans with multiple stresses and formulate multistress test plans based on different objectives and practical constraints. We develop a simulated annealing algorithm to efficiently determine the testing plan parameters. We demonstrate the proposed method with examples based on an actual test conducted using three stress types. The obtained optimal test plans are compared with those based on fractional factorial design. © 2013 Wiley Periodicals, Inc. Naval Research Logistics 60: 468–478, 2013     

Optimal design of accelerated life tests under periodic inspection

For the exponentially distributed lifetimes, optimal accelerated life test plans are determined under the assumptions of periodic inspection and Type I censoring. Computational results indicate that for the range of parameter values considered the asymptotic variance of the estimated mean or pth quantile at the use stress is not sensitive to the number of inspections at overstress levels. Senstivity analyses are also conducted to see how senstive the asymptotic variance of the estimated mean is with respect to the uncertainties involved in the guessed failure probabilities at the use and high stress levels. Computational results show that moderate deviations (several tens of percents) of the guessed failure probabilities from their true values are fairly tolerable in terms of the relative amount of increase in the asymptotic variance of the estimated mean. Procedures for selecting a sample size and for determining whether or not to conduct an accelerated life test are also discussed.     

Optimal accelerated life test designs for Burr type XII distributions under periodic inspection and type I censoring

This article develops optimal accelerated life test designs for Burr Type XII distributions under periodic inspection and Type I censoring. It is assumed that the mean lifetime (the Burr XII scale parameter) is a log-linear function of stress and that the shape parameters are independent of stress. For given shape parameters, design stress and high test stress, the test design is optimized with respect to the low test stress and the proportion of test units allocated to the low stress. The optimality criterion is the asymptotic variance of the maximum-likelihood estimator of log mean life at the design stress with the use of equally spaced inspection times. Computational results for various values of the shape parameters show that this criterion is insensitive to the number of inspection times and to misspecification of imputed failure probabilities at the design and high test stresses. Procedures for planning an accelerated life test, including selection of sample size, are also discussed. It is shown that optimal designs previously obtained for exponential and Weibull distributions are similar to those obtained here for the appropriate special cases of the Burr XII distribution. Thus the Burr XII distribution is a useful and widely applicable family of reliability models for ALT design. © 1996 John Wiley & Sons, Inc.     

Optimum step‐stress accelerated life test plans for log‐location‐scale distributions

This article presents new tools and methods for finding optimum step‐stress accelerated life test plans. First, we present an approach to calculate the large‐sample approximate variance of the maximum likelihood estimator of a quantile of the failure time distribution at use conditions from a step‐stress accelerated life test. The approach allows for multistep stress changes and censoring for general log‐location‐scale distributions based on a cumulative exposure model. As an application of this approach, the optimum variance is studied as a function of shape parameter for both Weibull and lognormal distributions. Graphical comparisons among test plans using step‐up, step‐down, and constant‐stress patterns are also presented. The results show that depending on the values of the model parameters and quantile of interest, each of the three test plans can be preferable in terms of optimum variance. © 2008 Wiley Periodicals, Inc. Naval Research Logistics, 2008     

A nonparametric approach to accelerated life testing under multiple stresses

Accelerated life testing (ALT) is concerned with subjecting items to a series of stresses at several levels higher than those experienced under normal conditions so as to obtain the lifetime distribution of items under normal levels. A parametric approach to this problem requires two assumptions. First, the lifetime of an item is assumed to have the same distribution under all stress levels, that is, a change of stress level does not change the shape of the life distribution but changes only its scale. Second, a functional relationship is assumed between the parameters of the life distribution and the accelerating stresses. A nonparametric approach, on the other hand, assumes a functional relationship between the life distribution functions at the accelerated and nonaccelerated stress levels without making any assumptions on the forms of the distribution functions. In this paper, we treat the problem nonparametrically. In particular, we extend the methods of Shaked, Zimmer, and Ball [7] and Strelec and Viertl [8] and develop a nonparametric estimation procedure for a version of the generalized Arrhenius model with two stress variables assuming a linear acceleration function. We obtain consistent estimates as well as confidence intervals of the parameters of the life distribution under normal stress level and compare our nonparametric method with parametric methods assuming exponential, Weibull and lognormal life distributions using both real life and simulated data. © 1998 John Wiley & Sons, Inc. Naval Research Logistics 45: 629–644, 1998     

Planning accelerated life tests for censored two‐parameter exponential distributions

We consider optimal test plans involving life distributions with failure‐free life, i.e., where there is an unknown threshold parameter below which no failure will occur. These distributions do not satisfy the regularity conditions and thus the usual approach of using the Fisher information matrix to obtain an optimal accelerated life testing (ALT) plan cannot be applied. In this paper, we assume that lifetime follows a two‐parameter exponential distribution and the stress‐life relationship is given by the inverse power law model. Near‐optimal test plans for constant‐stress ALT under both failure‐censoring and time‐censoring are obtained. We first obtain unbiased estimates for the parameters and give the approximate variance of these estimates for both failure‐censored and time‐censored data. Using these results, the variance for the approximate unbiased estimate of a percentile at a design stress is computed and then minimized to produce the near‐optimal plan. Finally, a numerical example is presented together with simulation results to study the accuracy of the approximate variance given by the proposed plan and show that it outperforms the equal‐allocation plan. © 1999 John Wiley & Sons, Inc. Naval Research Logistics 46: 169–186, 1999     

基于似然比检验的橡胶密封件加速试验机理一致性判别方法

加速退化试验广泛应用于橡胶密封件等长寿命产品的可靠性评估,试验过程中需要将高应力水平下的试验结果外推到正常应力水平。要获得准确的产品可靠性评估结果,需要保证加速应力下的退化失效机理与正常应力下的退化失效机理一致。基于似然比检验原理,提出加速退化试验机理一致性判别方法及流程。针对失效机理一致与失效机理变化两种场合,提出对数线性及非对数线性两类加速模型,并结合混合效应模型描述产品退化过程。利用似然比检验判断加速模型参数是否变化,完成失效机理一致性判别。仿真算例和应用实例表明,该方法能够有效判别橡胶密封件失效机理是否变化,并找到失效机理不变的应力水平边界。     

Bayesian estimation and optimal designs in partially accelerated life testing

A method of life testing is proposed which combines both ordinary and accelerated life-testing procedures. It is assumed that an item can be tested either in a standard environment or under stress. The amount of stress is fixed in advance and is the same for all items to be tested However, the time x at which an item on lest is taken out of the standard environment and put under stress can be chosen by the experimenter subject to a given cost structure. When an item is put under stress its lifetime is changed by the factor α. Let the random variable T denote the lifetime of an item in the standard environment, and let γ denote its lifetime under the partially accelerated test procedure just described. Then Y = T if T ≦ x, and Y = x + α (T > x) if T > x. It is assumed that T has an exponential distribution with parameter θ. The estimation of θ and α and the optimal design of a partially accelerated life test are studied in the framework of Bayesian decision theory.     

Accelerated life test plans under intermittent inspection and type-I censoring: The case of weibull failure distribution

For the case where the lifetime at a stress level has a Weibull distribution, statistically optimal and practical accelerated life test plans are developed under the assumptions of intermittent inspection and Type-I censoring. For a statistically optimal plan the low stress level, the proportion of test units allocated, and the inspection times are determined such that the asymptotic variance of the maximum-likelihood estimator of a certain quantile at the use condition is minimized. Although the practical plan adopts the same design criterion, it involves three rather than two overstress levels and easily calculated inspection schemes. Despite some loss in efficiency the practical plan has several advantages over the statistically optimal one. For instance, the practical plan can provide means for checking the validity of the assumptions made, may reduce the danger of extrapolation, and is more convenient to determine and implement. Computational experiments are conducted to evaluate the relative efficiency of a practical plan to the corresponding statistically optimal plan. Guidelines for selecting an appropriate practical plan are also described with an example.     

A general model for accelerated life testing with time‐dependent covariates

This paper introduces a general or “distribution‐free” model to analyze the lifetime of components under accelerated life testing. Unlike the accelerated failure time (AFT) models, the proposed model shares the advantage of being “distribution‐free” with the proportional hazard (PH) model and overcomes the deficiency of the PH model not allowing survival curves corresponding to different values of a covariate to cross. In this research, we extend and modify the extended hazard regression (EHR) model using the partial likelihood function to analyze failure data with time‐dependent covariates. The new model can be easily adopted to create an accelerated life testing model with different types of stress loading. For example, stress loading in accelerated life testing can be a step function, cyclic, or linear function with time. These types of stress loadings reduce the testing time and increase the number of failures of components under test. The proposed EHR model with time‐dependent covariates which incorporates multiple stress loadings requires further verification. Therefore, we conduct an accelerated life test in the laboratory by subjecting components to time‐dependent stresses, and we compare the reliability estimation based on the developed model with that obtained from experimental results. The combination of the theoretical development of the accelerated life testing model verified by laboratory experiments offers a unique perspective to reliability model building and verification. © 1999 John Wiley & Sons, Inc. Naval Research Logistics 46: 303–321, 1999     

Comparison between constant‐stress and step‐stress accelerated life tests under Time Constraint

By running life tests at higher stress levels than normal operating conditions, accelerated life testing (ALT) quickly yields information on the lifetime distribution of a test unit. The lifetime at the design stress is then estimated through extrapolation using a regression model. In constant‐stress testing, a unit is tested at a fixed stress level until failure or the termination time point of test, whereas step‐stress testing allows the experimenter to gradually increase the stress levels at some prefixed time points during the test. In this work, the optimal k‐level constant‐stress and step‐stress ALTs are compared for the exponential failure data under complete sampling and Type‐I censoring. The objective is to quantify the advantage of using the step‐stress testing relative to the constant‐stress one. Assuming a log‐linear life–stress relationship with the cumulative exposure model for the effect of changing stress in step‐stress testing, the optimal design points are determined under C/D/A‐optimality criteria. The efficiency of step‐stress testing to constant‐stress one is then discussed in terms of the ratio of optimal objective functions based on the information matrix. © 2013 Wiley Periodicals, Inc. Naval Research Logistics 00: 000–000, 2013     

定数截尾的恒定应力加速寿命试验的优化设计

在指数分布场合下讨论了恒加试验的最优设计问题 ,得到了一系列与步加试验相对应的结果 .这里的最优准则是指正常应力水平下产品对数平均寿命估计的方差的极小化 .     

基于RBF网络加速模型的可靠性评估

在可靠性加速试验中,由于各种不同的应力引起的失效机理不一样,不同应力之间可能还存在着相互耦合作用,要将它们和寿命结合,找出一个能真实描述客观情况的加速模型是相当困难的,仅仅依据有限的试验数据建立产品的加速模型存在很大难度和风险,为此提出了一种基于RBF网络加速模型的可靠性评估方法．该方法将加速寿命试验中的加速应力和可靠度作为训练网络的输入向量,相应的时间作为目标向量对网络进行训练,根据网络收敛速和误差精度等情况调整隐含层单元个数,直至得到最优的网络．最后,以实例说明了该方法的有效性和实用性．     

Designing an optimal life test with type I censoring

The present study considers the design of an optimal life test plan with Type I censoring in the case where only one testing machine is available and a machine tests items sequentially as seen in fatigue life tests of metallic materials. Under the condition that the life test is conducted in a fixed censoring time and with a fixed number of test items, a method for determining the censoring time and the number of test items is proposed from the Bayesian point of view. The proposed method is also applied to the Weibull life distribution with a known shape parameter.     

An economic sequential screening procedure for limited failure populations

An economic sequential screening procedure is considered for limited failure populations in which defective items fail soon after they are put in operation and nondefective ones never fail during the technical life of the items. A cost model is constructed that involves screening test cost and external failure cost. A sequential scheme that minimizes the expected cost is derived from the solution of a dynamic programming formulation and the optimal decision at each stage is obtained in a closed form. © 1994 John Wiley & Sons, Inc.     

Incremental approximation of optimal allocations

This paper concerns the approximation of optimal allocations by δ allocations. δ allocations are obtained by fixing an increment δ of effort and deciding at each step upon a single cell in which to allocate the entire increment. It is shown that δ allocations may be used as a simple method of approximating optimal allocations of effort resulting from constrained separable optimization problems involving a finite number of cells. The results are applied to find δ allocations (called δ plans) which approximate optimal search plans. δ plans have the property that as δ → 0, the mean time to find the target using a δ plan approaches the mean time when using the optimal plan. δ plans have the advantage that. they are easily computed and more easily realized in practice than optimal plans which tend to be difficult to calculate and to call for spreading impractically small amounts of effort over large areas.     

基于步进加速寿命试验的制导弹药储存寿命评估

介绍步进应力加速寿命试验原理,通过对制导弹药自动导引头贮存状态和失效机理的分析,确定了加速寿命试验应力和应力水平．假设产品寿命服从威布尔分布,应用极大似然估计和Bayes的方法处理数据,建立制导弹药可靠储存寿命预测模型,并计算得到自动导引头在正常应力水平下的可靠储存寿命．     

Global planning of accelerated degradation tests based on exponential dispersion degradation models

The accelerated degradation test (ADT) is an efficient tool for assessing the lifetime information of highly reliable products. However, conducting an ADT is very expensive. Therefore, how to conduct a cost-constrained ADT plan is a great challenging issue for reliability analysts. By taking the experimental cost into consideration, this paper proposes a semi-analytical procedure to determine the total sample size, testing stress levels, the measurement frequencies, and the number of measurements (within a degradation path) globally under a class of exponential dispersion degradation models. The proposed method is also extended to determine the global planning of a three-level compromise plan. The advantage of the proposed method not only provides better design insights for conducting an ADT plan, but also provides an efficient algorithm to obtain a cost-constrained ADT plan, compared with conventional optimal plans by grid search algorithms.     

Optimum simple step-stress accelerated life tests for weibull distribution and type I censoring

This article presents an optimum simple step-stress accelerated life test for the Weibull distribution under Type I censoring. It is assumed that a log-linear relationship exists between the Weibull scale parameter and the (possibly transformed) stress and that a certain cumulative exposure model for the effect of changing stress holds. The optimum plan—low stress and stress change time—is obtained, which minimizes the asymptotic variance of the maximum likelihood estimator of a stated percentile at design stress. For selected values of the design parameters, nomographs useful for finding the optimum plan are given, and the effects of errors in preestimates of the parameters are investigated. As an alternative to the simple step-stress test, a three-level compromise plan is proposed, and its performance is studied and compared with that of the optimum simple step-stress test. © 1993 John Wiley & Sons. Inc.     

Optimal design of accelerated life testing plans for periodical replacement with penalty

Accelerated life testing (ALT), enhanced by optimal test plans, has been widely accepted in practice as a quick approach for estimating the reliability of a product. From the estimation result, preventive maintenance schedules can be determined to ensure the performance of the product under its normal operating conditions. By default, maintenance decision‐making is regarded as the last and least rewarding step. However, sometimes the maintenance schedules, such as preventive maintenance intervals, are predetermined due to customer concerns and/or by various mandatory regulations and rules. Under such circumstances, how to accurately estimate the expenditure (e.g., on maintenance or spare parts management) associated with these maintenance requirements becomes an important issue. A viable solution is to incorporate the maintenance requirements into ALT plans. This paper provides an approach for the optimal design of ALT plans oriented by a mandatory periodical replacement schedule subject to a discounted penalty. The objective is to improve the estimation accuracy of the economic impact of this maintenance requirement. A numerical experiment is provided to demonstrate the approach in practical use. © 2008 Wiley Periodicals, Inc. Naval Research Logistics 2009