A model for step‐stress accelerated life testing

Modern technology is producing high reliability products. Life testing for such products under normal use condition takes a lot of time to obtain a reasonable number of failures. In this situation a step‐stress procedure is preferred for accelerated life testing. In this paper we assume a Weibull and Lognormal model whose scale parameter depends upon the present level as well as the age at the entry in the present stress level. On the basis of that we propose a parametric model to the life distribution for step‐stress testing and suggest a suitable design to estimate the parameters involved in the model. A simulation study has been done by the proposed model based on maximum likelihood estimation. © 2003 Wiley Periodicals, Inc. Naval Research Logistics, 2003     

Estimation for a weibull accelerated life testing model

It is sometimes reasonable to assume that the lifetime distribution of an item belongs to a certain parametric family, and that actual parameter values depend upon the testing environment of the item. In the two-parameter Weibull family setting, suppose both the shape and scale parameters are expressible as functions of the testing environment. For various models of functional dependency on environment, maximum likelihood methods are used to estimate characteristics of interest at specified environmental levels. The methodology presented handles exact, censored, and grouped data. A detailed accelerated life testing analysis of stress-rupture data for Kevlar/epoxy composites is given.     

Equivalent accelerated life testing plans for log‐location‐scale distributions

Accelerated life testing (ALT) is widely used to determine the failure time distribution of a product and the associated life‐stress relationship in order to predict the product's reliability under normal operating conditions. Many types of stress loadings such as constant‐stress, step‐stress and cyclic‐stress can be utilized when conducting ALT. Extensive research has been conducted on the analysis of ALT data obtained under a specified stress loading. However, the equivalency of ALT experiments involving different stress loadings has not been investigated. In this article, a log‐location‐scale distribution under Type I censoring is considered in planning ALT. An idea is provided for the equivalency of various ALT plans involving different stress loadings. Based on this idea, general equivalent ALT plans and some special types of equivalent ALT plans are explored. For demonstration, a constant‐stress ALT and a ramp‐stress ALT for miniature lamps are presented and their equivalency is investigated. © 2010 Wiley Periodicals, Inc. Naval Research Logistics, 2010     

A dynamic general linear model for inference from accelerated life tests

We present a new approach for inference from accelerated life tests. Our approach is based on a dynamic general linear model setup which arises naturally from the accelerated life-testing problem and uses linear Bayesian methods for inference. The advantage of the procedure is that it does not require large numbers of items to be tested and that it can deal with both censored and uncensored data. We illustrate the use of our approach with some actual accelerated life-test data. © 1992 John Wiley & Sons, Inc.     

Managing components for assemble‐to‐order products with lead‐time‐dependent pricing: The full‐shipment model

We study a component inventory planning problem in an assemble‐to‐order environment faced by many contract manufacturers in which both quick delivery and efficient management of component inventory are crucial for the manufacturers to achieve profitability in a highly competitive market. Extending a recent study in a similar problem setting by the same authors, we analyze an optimization model for determining the optimal component stocking decision for a contract manufacturer facing an uncertain future demand, where product price depends on the delivery times. In contrast to our earlier work, this paper considers the situation where the contract manufacturer needs to deliver the full order quantity in one single shipment. This delivery requirement is appropriate for many industries, such as the garment and toy industries, where the economies of scale in transportation is essential. We develop efficient solution procedures for solving this optimization problem. We use our model results to illustrate how the different model parameters affect the optimal solution. We also compare the results under this full‐shipment model with those from our earlier work that allows for multiple partial shipments. © 2007 Wiley Periodicals, Inc. Naval Research Logistics, 2007     

恒定应力加速寿命试验的非参数统计方法

在恒定应力加速寿命试验 (简称恒加试验 )的统计分析中 ,非参数统计方法具有一定的实际价值 .在一定的假定下 ,文中给出了两种新估计 ,并证明了它们的优良性     

Optimal design of accelerated life testing plans for periodical replacement with penalty

Accelerated life testing (ALT), enhanced by optimal test plans, has been widely accepted in practice as a quick approach for estimating the reliability of a product. From the estimation result, preventive maintenance schedules can be determined to ensure the performance of the product under its normal operating conditions. By default, maintenance decision‐making is regarded as the last and least rewarding step. However, sometimes the maintenance schedules, such as preventive maintenance intervals, are predetermined due to customer concerns and/or by various mandatory regulations and rules. Under such circumstances, how to accurately estimate the expenditure (e.g., on maintenance or spare parts management) associated with these maintenance requirements becomes an important issue. A viable solution is to incorporate the maintenance requirements into ALT plans. This paper provides an approach for the optimal design of ALT plans oriented by a mandatory periodical replacement schedule subject to a discounted penalty. The objective is to improve the estimation accuracy of the economic impact of this maintenance requirement. A numerical experiment is provided to demonstrate the approach in practical use. © 2008 Wiley Periodicals, Inc. Naval Research Logistics 2009     

A stochastic model for burn‐in procedures in accelerated environment

Burn‐in procedure is a manufacturing technique that is intended to eliminate early failures of system or product. Burning‐in a component or system means to subject it to a period of use prior to being used in field. Generally, burn‐in is considered expensive and so the length of burn‐in is typically limited. Thus, burn‐in is most often accomplished in an accelerated environment in order to shorten the burn‐in process. A new failure rate model for an accelerated burn‐in procedure, which incorporates the accelerated ageing process induced by the accelerated environmental stress, is proposed. Under a more general assumption on the shape of failure rate function of products, which includes the traditional bathtub‐shaped failure rate function as a special case, upper bounds for optimal burn‐in time will be derived. A numerical example will also be given for illustration. © 2006 Wiley Periodicals, Inc. Naval Research Logistics, 2006     

A nonparametric approach to accelerated life testing under multiple stresses

Accelerated life testing (ALT) is concerned with subjecting items to a series of stresses at several levels higher than those experienced under normal conditions so as to obtain the lifetime distribution of items under normal levels. A parametric approach to this problem requires two assumptions. First, the lifetime of an item is assumed to have the same distribution under all stress levels, that is, a change of stress level does not change the shape of the life distribution but changes only its scale. Second, a functional relationship is assumed between the parameters of the life distribution and the accelerating stresses. A nonparametric approach, on the other hand, assumes a functional relationship between the life distribution functions at the accelerated and nonaccelerated stress levels without making any assumptions on the forms of the distribution functions. In this paper, we treat the problem nonparametrically. In particular, we extend the methods of Shaked, Zimmer, and Ball [7] and Strelec and Viertl [8] and develop a nonparametric estimation procedure for a version of the generalized Arrhenius model with two stress variables assuming a linear acceleration function. We obtain consistent estimates as well as confidence intervals of the parameters of the life distribution under normal stress level and compare our nonparametric method with parametric methods assuming exponential, Weibull and lognormal life distributions using both real life and simulated data. © 1998 John Wiley & Sons, Inc. Naval Research Logistics 45: 629–644, 1998     

Optimum step‐stress accelerated life test plans for log‐location‐scale distributions

This article presents new tools and methods for finding optimum step‐stress accelerated life test plans. First, we present an approach to calculate the large‐sample approximate variance of the maximum likelihood estimator of a quantile of the failure time distribution at use conditions from a step‐stress accelerated life test. The approach allows for multistep stress changes and censoring for general log‐location‐scale distributions based on a cumulative exposure model. As an application of this approach, the optimum variance is studied as a function of shape parameter for both Weibull and lognormal distributions. Graphical comparisons among test plans using step‐up, step‐down, and constant‐stress patterns are also presented. The results show that depending on the values of the model parameters and quantile of interest, each of the three test plans can be preferable in terms of optimum variance. © 2008 Wiley Periodicals, Inc. Naval Research Logistics, 2008     

Planning accelerated life tests for censored two‐parameter exponential distributions

We consider optimal test plans involving life distributions with failure‐free life, i.e., where there is an unknown threshold parameter below which no failure will occur. These distributions do not satisfy the regularity conditions and thus the usual approach of using the Fisher information matrix to obtain an optimal accelerated life testing (ALT) plan cannot be applied. In this paper, we assume that lifetime follows a two‐parameter exponential distribution and the stress‐life relationship is given by the inverse power law model. Near‐optimal test plans for constant‐stress ALT under both failure‐censoring and time‐censoring are obtained. We first obtain unbiased estimates for the parameters and give the approximate variance of these estimates for both failure‐censored and time‐censored data. Using these results, the variance for the approximate unbiased estimate of a percentile at a design stress is computed and then minimized to produce the near‐optimal plan. Finally, a numerical example is presented together with simulation results to study the accuracy of the approximate variance given by the proposed plan and show that it outperforms the equal‐allocation plan. © 1999 John Wiley & Sons, Inc. Naval Research Logistics 46: 169–186, 1999     

Design of accelerated life testing plans under multiple stresses

Accelerated life testing (ALT) using multiple stresses is commonly used in practice to resemble the operating stresses at normal operating conditions and obtain failure observations in a much shorter time. However, to date, there is little research into the theory of planning ALT for reliability estimation with multiple stresses. ALT with multiple stresses can result in a large number of stress‐level combinations which presents a challenge for implementation. In this article, we propose an approach for the design of ALT plans with multiple stresses and formulate multistress test plans based on different objectives and practical constraints. We develop a simulated annealing algorithm to efficiently determine the testing plan parameters. We demonstrate the proposed method with examples based on an actual test conducted using three stress types. The obtained optimal test plans are compared with those based on fractional factorial design. © 2013 Wiley Periodicals, Inc. Naval Research Logistics 60: 468–478, 2013     

Bayesian estimation and optimal designs in partially accelerated life testing

A method of life testing is proposed which combines both ordinary and accelerated life-testing procedures. It is assumed that an item can be tested either in a standard environment or under stress. The amount of stress is fixed in advance and is the same for all items to be tested However, the time x at which an item on lest is taken out of the standard environment and put under stress can be chosen by the experimenter subject to a given cost structure. When an item is put under stress its lifetime is changed by the factor α. Let the random variable T denote the lifetime of an item in the standard environment, and let γ denote its lifetime under the partially accelerated test procedure just described. Then Y = T if T ≦ x, and Y = x + α (T > x) if T > x. It is assumed that T has an exponential distribution with parameter θ. The estimation of θ and α and the optimal design of a partially accelerated life test are studied in the framework of Bayesian decision theory.     

Network design for time‐constrained delivery

To meet customer demand, delivery companies are offering an increasing number of time‐definite services. In this article, we examine the strategic design of delivery networks which can efficiently provide these services. Because of the high cost of direct connections, we focus on tree‐structured networks. As it may not be possible to identify a tree‐structured network that satisfies all of the delivery guarantees, we allow these guarantees to be violated but seek to minimize the sum of the violations. We establish the complexity of the problem and exploit an empirically identified solution structure to create new neighborhoods which improve solution values over more general neighborhood structures. © 2008 Wiley Periodicals, Inc. Naval Research Logistics, 2008     

Comparison between constant‐stress and step‐stress accelerated life tests under Time Constraint

By running life tests at higher stress levels than normal operating conditions, accelerated life testing (ALT) quickly yields information on the lifetime distribution of a test unit. The lifetime at the design stress is then estimated through extrapolation using a regression model. In constant‐stress testing, a unit is tested at a fixed stress level until failure or the termination time point of test, whereas step‐stress testing allows the experimenter to gradually increase the stress levels at some prefixed time points during the test. In this work, the optimal k‐level constant‐stress and step‐stress ALTs are compared for the exponential failure data under complete sampling and Type‐I censoring. The objective is to quantify the advantage of using the step‐stress testing relative to the constant‐stress one. Assuming a log‐linear life–stress relationship with the cumulative exposure model for the effect of changing stress in step‐stress testing, the optimal design points are determined under C/D/A‐optimality criteria. The efficiency of step‐stress testing to constant‐stress one is then discussed in terms of the ratio of optimal objective functions based on the information matrix. © 2013 Wiley Periodicals, Inc. Naval Research Logistics 00: 000–000, 2013     

Many‐server loss models with non‐poisson time‐varying arrivals

This article proposes an approximation for the blocking probability in a many‐server loss model with a non‐Poisson time‐varying arrival process and flexible staffing (number of servers) and shows that it can be used to set staffing levels to stabilize the time‐varying blocking probability at a target level. Because the blocking probabilities necessarily change dramatically after each staffing change, we randomize the time of each staffing change about the planned time. We apply simulation to show that (i) the blocking probabilities cannot be stabilized without some form of randomization, (ii) the new staffing algorithm with randomiation can stabilize blocking probabilities at target levels and (iii) the required staffing can be quite different when the Poisson assumption is dropped. © 2017 Wiley Periodicals, Inc. Naval Research Logistics 64: 177–202, 2017     

A general model of heterogeneous system lifetimes and conditions for system burn‐in

Burn‐in is a technique to enhance reliability by eliminating weak items from a population of items having heterogeneous lifetimes. System burn‐in can improve system reliability, but the conditions for system burn‐in to be performed after component burn‐in remain a little understood mathematical challenge. To derive such conditions, we first introduce a general model of heterogeneous system lifetimes, in which the component burn‐in information and assembly problems are related to the prediction of system burn‐in. Many existing system burn‐in models become special cases and two important results are identified. First, heterogeneous system lifetimes can be understood naturally as a consequence of heterogeneous component lifetimes and heterogeneous assembly quality. Second, system burn‐in is effective if assembly quality variation in the components and connections which are arranged in series is greater than a threshold, where the threshold depends on the system structure and component failure rates. © 2003 Wiley Periodicals, Inc. Naval Research Logistics 50: 364–380, 2003.     

On optimality of one‐bug‐look‐ahead policies for a software testing model

The optimality of the One‐Bug‐Look‐Ahead (OLA) software release policy proposed by Morali and Soyer ( 15 ) is re‐examined in this paper. A counterexample is constructed to show that OLA is not optimal in general. The optimal stopping approach is then called upon to prove that OLA possesses weaker sense of optimality under conditional monotonicity and the strong sense of optimality holds under a more restrictive sample‐wise monotonicity condition. The NTDS data are analyzed for illustration, and OLA is shown to be robust with respect to model parameters. © 2007 Wiley Periodicals, Inc. Naval Research Logistics, 2007.     

A dynamic model for component testing

We consider the component testing problem of a system where the main feature is that the component failure rates are not constant parameters, but they change in a dynamic fashion with respect to time. More precisely, each component has a piecewise-constant failure-rate function such that the lifetime distribution is exponential with a constant rate over local intervals of time within the overall mission time. There are several such intervals, and the rates change dynamically from one interval to another. We note that these lifetime distributions can also be used in a more general setting to approximate arbitrary lifetime distributions. The optimal component testing problem is formulated as a semi-infinite linear program. We present an algorithmic procedure to compute optimal test times based on the column-generation technique and illustrate it with a numerical example. © 1997 John Wiley & Sons, Inc. Naval Research Logistics 44: 187–197, 1997