Stage life testing

In progressive censoring, items are removed at certain times during the life test. Commonly, it is assumed that the removed items are used for further testing. In order to take into account information about these additional testing in inferential procedures, we propose a two‐step model of stage life testing with one fixed stage‐change time which incorporates information about both the removed items (further tested under different conditions) and those remaining in the current life test. We show that some marginal distributions in our model correspond either to progressive censoring with a fixed censoring time or to a simple‐step stress model. Furthermore, assuming a cumulative exposure model, we establish exact inferential results for the distribution parameters when the lifetimes are exponentially distributed. An extension to Weibull distributed lifetimes is also discussed.     

A note on a modified block replacement policy for units with increasing marginal running costs

The model for a modified block replacement policy (MBRP) is extended to include running costs. An illustrative example is worked out for the case when item life is exponentially distributed and marginal running cost per unit time increases linearly with the age of the item.     

Optimal replacement rules based on different information levels

We consider the following replacement model in reliability theory. A technical system with random lifetime is replaced upon failure. Preventive replacements can be carried out before failure. The time for such a replacement depends on the observation of a random state parameter and is therefore in general a random time. Different costs for preventive and failure replacements are introduced which may depend on the age of the working system. The optimization criterion followed here to find an optimal replacement time is to minimize the total expected discounted costs. The optimal replacement policy depends on the observation of the state of the system. Results of the theory of stochastic processes are used to obtain the optimal strategy for different information levels. Several examples based on a two-component parallel system with possibly dependent component lifetimes show how the optimal replacement policy depends on the different information levels and on the degree of dependence of the components. © 1992 John Wiley & Sons, Inc.     

Localization of optimal strategies in certain games

Assume the payoffs of a matrix game are concave in the index of the maximizing player. That player is shown to have an optimal strategy which uses at most two consecutive pure strategies, identifiable through approximate solution of a related continuous game. Generalizations are given, and the results are applied to a motivating hidden-target model due to Shapley. © 1994 John Wiley & Sons, Inc.     

Eisenhower,science and the nuclear test Ban Debate 1953–56

Though historians debate whether Eisenhower seriously pursued a nuclear test ban agreement at the close of his presidency, few have closely examined his consideration of the issue during his first term in office. Publicly, his administration ridiculed Democratic presidential candidate Adlai E. Stevenson's highly publicized test ban proposal in 1956. In fact, Eisenhower's private inclination to ban testing antedated Stevenson's campaign proposal by two years. A review of the administration's techniques of countering Stevenson's test ban proposal reveals the use of heated rhetoric, clever deception, and outright lies to manipulate public understanding of the test issue and to conceal the depth of Eisenhower's own sincere desire to limit, or even cease, tests.     

A partitioning technique for obtaining solutions to the modularization problem

A significant problem in electronic system design is that of partitioning the functional elements of an equipment schematic into subsets which may be regarded as modules. The collection of all such subsets generated by a particular partitioning forms a potential modular design. The specific problem is to determine that partitioning of the schematic that minimizes a cost function defined on the subsets subject to specified hardware, design, packaging, and inventory constraints. This problem is termed the modularization problem. This paper presents a method for obtaining restricted solutions to the modularization problem by employing some recent developments in linear graph theory obtained by one of the coauthors. Numerical results from the solution of several typical problems are presented.