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791.
基于3D-IC技术实现的3D SRAM,其电路中使用了大量的TSV。目前TSV制造工艺尚未成熟,使得TSV容易出现开路或短路故障,从而给3D SRAM的测试带来新的挑战。现有的2D BIST测试方式能够探测到3D SRAM中存在的故障,但并不能判定是TSV故障还是存储器本身故障;TSV专用测试电路虽然能够探测出TSV的故障,但需要特定的测试电路来实现,这就增加了额外的面积开销,同时加大了电路设计复杂度。基于此,本文提出了一种使用测试算法来探测TSV开路故障的方法,在不使用TSV专用测试电路且不增加额外面积开销的情况下通过BIST电路解决3D SRAM中TSV的开路故障检测问题。结果显示该TSV测试算法功能正确,能够准确探测到TSV的开路故障,并快速定位TSV的开路位置。 相似文献
792.
针对欺骗干扰信号难以有效实时模拟真实卫星信号空间分布特性的特点,本文提出了利用双天线载波相位差进行欺骗信号检测的方法。在已知接收机天线阵基线以及姿态条件下,同一路信号在两副天线上表现出的相位差与天线基线长度与信号入射相关。而信号入射角是空间信号的物理传播特性,欺骗干扰源无法通过数字方式改变。以通过卫星星历获取所跟踪卫星的精确位置为先验信息,即可确定真实信号在已知天线阵上的载波相位差,从而实现对欺骗信号的有效检测。本文分析了载波相位差计算的各种误差源,并在此基础上建立了针对欺骗信号的二元假设检验。最后,通过理论分析和仿真实验,验证了本文提出的欺骗信号检测技术的有效性,并得出了天线阵基线越长、入射方位角越小,载波相位差检测技术对欺骗信号的检测性能越优的结论。 相似文献
793.
针对欺骗干扰信号难以有效实时模拟真实卫星信号空间分布特性的特点,提出利用双天线载波相位差进行欺骗信号检测的方法。分析载波相位差计算的各种误差源,并在此基础上建立针对欺骗信号的二元假设检验。通过理论分析和仿真实验,验证了所提欺骗信号检测技术的有效性,并得出了天线阵基线越长、入射方位角越小,载波相位差检测技术对欺骗信号的检测性能越优的结论。 相似文献
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James Flynn 《海军后勤学研究》2001,48(5):430-449
Consider an N‐item, periodic review, infinite‐horizon, undiscounted, inventory model with stochastic demands, proportional holding and shortage costs, and full backlogging. For 1 ≤ j ≤ N, orders for item j can arrive in every period, and the cost of receiving them is negligible (as in a JIT setting). Every Tj periods, one reviews the current stock level of item j and decides on deliveries for each of the next Tj periods, thus incurring an item‐by‐item fixed cost kj. There is also a joint fixed cost whenever any item is reviewed. The problem is to find review periods T1, T2, …, TN and an ordering policy satisfying the average cost criterion. The current article builds on earlier results for the single‐item case. We prove an optimal policy exists, give conditions where it has a simple form, and develop a branch and bound algorithm for its computation. We also provide two heuristic policies with O(N) computational requirements. Computational experiments indicate that the branch and bound algorithm can handle normal demand problems with N ≤ 10 and that both heuristics do well for a wide variety of problems with N ranging from 2 to 200; moreover, the performance of our heuristics seems insensitive to N. © 2001 John Wiley & Sons, Inc. Naval Research Logistics 48:430–449, 2001 相似文献
797.
Acceptance sampling plans are used to assess the quality of an ongoing production process, in addition to the lot acceptance. In this paper, we consider sampling inspection plans for monitoring the Markov‐dependent production process. We construct sequential plans that satisfy the usual probability requirements at acceptable quality level and rejectable quality level and, in addition, possess the minimum average sample number under semicurtailed inspection. As these plans result in large sample sizes, especially when the serial correlation is high, we suggest new plans called “systematic sampling plans.” The minimum average sample number systematic plans that satisfy the probability requirements are constructed. Our algorithm uses some simple recurrence relations to compute the required acceptance probabilities. The optimal systematic plans require much smaller sample sizes and acceptance numbers, compared to the sequential plans. However, they need larger production runs to make a decision. Tables for choosing appropriate sequential and systematic plans are provided. The problem of selecting the best systematic sampling plan is also addressed. The operating characteristic curves of some of the sequential and the systematic plans are compared, and are observed to be almost identical. © 2001 John Wiley & Sons, Inc. Naval Research Logistics 48: 451–467, 2001 相似文献
798.
A 2‐dimensional rectangular (cylindrical) k‐within‐consecutive‐r × s‐out‐of‐m × n:F system is the rectangular (cylindrical) m × n‐system if the system fails whenever k components in a r × s‐submatrix fail. This paper proposes a recursive algorithm for the reliability of the 2‐dimensional k‐within‐consecutive‐r × s‐out‐m × n:F system, in the rectangular case and the cylindrical case. This algorithm requires min ( O (mkr(n?s)), O (nks(m?r))), and O (mkrn) computing time in the rectangular case and the cylindrical case, respectively. The proposed algorithm will be demonstrated and some numerical examples will be shown. © 2001 John Wiley & Sons, Inc. Naval Research Logistics 48: 625–637, 2001. 相似文献
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In this paper the problem of minimizing makespan in a two‐machine openshop is examined. A heuristic algorithm is proposed, and its worst case performance ratio and complexity are analyzed. The average case performance is evaluated using an empirical study. © 1999 John Wiley & Sons, Inc. Naval Research Logistics 46: 129–145, 1999 相似文献