典型人因可靠性分析方法评述

对比较典型的第一代和第二代人因可靠性分析方法进行综述。首先讨论人因可靠性的基本定义;然后选取几种比较有代表意义的第一代方法进行对比分析,以此为基础介绍第一代方法的基本思想和特征;接下来分析第二代人因可靠性分析方法中两种典型方法,讨论它们的基本特点,并分析它们相对于第一代人因可靠性分析方法的优势以及自身的一些问题;最后展望人因可靠性分析方法的发展趋势。     

Holmes’ front: constructing a new face of battle for America’s Civil War

ABSTRACT

In his seminal study of the changing nature of warfare between Agincourt and the Somme, military historian John Keegan proposed that future historians might consider combatants’ emotions in their assessments of the impact and nature of conflict. Recent years have witnessed the emergence of the history of emotions as an analytical approach, but rarely, if ever, is this directed toward the study of military history, far less the history of insurgencies and counter-insurgencies. This paper examines America’s civil war (1861–1865) as a case study of the ways in which an emotional history approach might illuminate not the physical experiences of but rather the immediate and longer-term reactions to counter-insurgency conflict through a focus on one specific individual, the future Supreme Court Justice Oliver Wendell Holmes, Jr. It proposes that Holmes, whilst not a man of the ranks, nevertheless can reveal the wider ramifications of civil war and its emotional impact, both individually and culturally. As a relatively limited internecine war, one not fought by professional armies but by volunteer forces, America’s civil war highlights the ways in which the soldier’s response points us toward the kind of emotional revolution that has, to date, mainly been located within the European nations.     

MPI并行程序中通信等待问题的诊断方法及其应用

随着并行规模的扩大,现有通信等待问题的诊断方法存在内存开销大、测量时间开销大等问题。通过对现有通信等待问题诊断方法的深入分析,同时考虑测量开销可控的实际需求,建立基于热点函数的通信等待问题诊断模型。基于上述模型,总结出一种更精简、更实用的通信等待问题诊断方法。将该诊断方法分别应用到二维LARED集成、LARED-S、LAP3D等大规模MPI并行程序的通信等待问题诊断过程,应用效果表明本诊断方法可精确定位导致通信等待问题的关键代码段,给出的优化方案及性能提升空间对于后续的程序改进具有参考价值,其中根据诊断结果优化后的LARED-S程序性能提升32%,通信等待时间减少44%。     

纳米SiO2改性聚合物锂离子电池的研究

研究了一种基于含氟聚合物的聚合物锂离子电池,考察了SiO2纳米粉对聚合物电解质隔膜的机械性能、吸液量以及电导率的影响,用电镜分析探讨了纳米改性聚合物电解质膜的微观结构;并以此纳米改性聚合物隔膜组装了小型的聚合物锂电池,研究了其电性能.