基于退化速率跟踪粒子滤波的剩余使用寿命预测框架

毋庸置疑,剩余使用寿命预测对于设备的健康管理越来越重要。近年来粒子滤波方法被越来越多地应用到设备寿命预测技术当中,这是因为粒子滤波方法能更好的解决非线性非高斯系统滤波问题,而且能够获得不确定度信息。但该方法的预测性能却过度依赖于预测模型,并且对于模型参数的初始分布也比较敏感,这在一定程度上限制了粒子滤波预测方法的进一步发展。本文针对基本粒子滤波预测方法的不足,提出了一种基于退化速率跟踪粒子滤波的通用预测框架,以历史观测数据的退化速率统计规律作为指导来跟踪目标数据的退化速率,实现对粒子滤波预测方法的简化。并将该方法用于轴承和锂离子电池的剩余使用寿命预测,验证了方法的有效性。     

多退化模式下的电子装备可靠性建模

通常加速退化分析中退化失效只考虑或者假设只有一个退化通道,而实际上很多情况下会存在多退化模式.产品的各个退化通道间的关系存在随机性,即任意两个退化通道间不可能只是单一的相关或者独立.在考虑这种相关性的条件下,深入研究了电子产品的性能退化理论和机理,提出了两个多退化模式竞争失效的数学模型,分别阐述了退化通道相关与独立的两种不同情况下产品可靠度评估方法.     

可见光助Fenton体系降解芥子气机理研究

以联吡啶铁为催化剂,采用光助Fenton体系在可见光照射条件下（λ〉450nm）降解芥子气。考察了不同反应条件下的降解效果,通过EPR分析确定了反应过程中产生的高活性物种,利用GC—MS和NMR等方法分析了反应的产物,跟踪了反应过程中TOC的变化,并根据实验结果研究了芥子气光催化降解的反应机理。     

步进加速退化试验及其在电子产品可靠性评估中的应用

为快速评估具有高可靠、长寿命特点的电子产品的可靠性,提出了使用步进加速退化试验技术的方法。文中首先给出了步进加速退化的试验方法及基本假设,然后给出了步进退化数据向恒加退化数据的折算方法,在此基础上提出了基于伪失效寿命的步进加速退化可靠性评估算法,最后利用试验数据对该方法进行了验证。该方法与恒加退化试验相比,在保持样本量不变的基础上,可以极大地缩短试验时间,因此,具有更高的效费比。     

Effect of operating temperature on aged single lap bonded joints

In recent decades, designers have increasingly focused on the stability of assemblies in composite materials over time, particularly when used in structural applications. The use of structural adhesives allows for realising assemblies without mechanical fasteners. In fact, bonding is an assembly technique that prevent corrosion, ensures uniform stresses in the joint, and grows the specific resistance of the assembly. The knowledge of the behaviour of bonded joint is necessary to ensure the reliability of this technique over time, especially in aggressive environments. The aim of this work consists in investigating the combined effect of hydrothermal ageing and temperature test on the lap shear strength of single lap joints realised in CFRP. The results showed a higher influence of the ageing on paste adhesive compared to film adhesive. However, the ageing, combined with the operating temperature, played a fundamental role on the shear strength of the bonded joints.     

Priori information analysis of optocoupler accelerated degradation experiment based on failure mechanism verification test

The optocoupler is a weak link in the inertial navigation platform of a kind of guided munitions. It is necessary to use accelerated storage test to verify the storage life of long storage products. Especially for small sample products, it is very important to obtain prior information for the design and implementation of accelerated degradation test. In this paper, the optocoupler failure mechanism verification test is designed and the experimental results are analyzed and the prior information is obtained. The results show that optocouplers have two failure modes, one is sudden failure and the other is degradation failure; the maximum temperature stress of optocoupler can't exceed 140 °C; the increase of leakage current of optocoupler is caused by movable ions contaminating the LED chip. The surface leakage current is proportional to the adsorption amount. The increase of leakage current makes p-n junction tunneling effect occur which LEDs the failure of the optocoupler. The lifetime distribution model of the optocoupler is determined by the failure physics. The lifetime of the optocoupler is subject to the lognormal distribution. The degeneracy orbit of the optocoupler leakage current is described by a power law model. The estimated values of the orbital parameters are initially calculated and the parameters of its life distribution function are deduced. The above information lays a good foundation for the optimization design and data processing of the accelerated degradation experiment.     

Designing a degradation experiment

Degradation experiments are widely used to assess the reliability of highly reliable products which are not likely to fail under the traditional life tests. In order to conduct a degradation experiment efficiently, several factors, such as the inspection frequency, the sample size, and the termination time, need to be considered carefully. These factors not only affect the experimental cost, but also affect the precision of the estimate of a product's lifetime. In this paper, we deal with the optimal design of a degradation experiment. Under the constraint that the total experimental cost does not exceed a predetermined budget, the optimal decision variables are solved by minimizing the variance of the estimated 100pth percentile of the lifetime distribution of the product. An example is provided to illustrate the proposed method. Finally, a simulation study is conducted to investigate the robustness of this proposed method. © 1999 John Wiley & Sons, Inc. Naval Research Logistics 46: 689–706, 1999     

Designing a screening experiment for highly reliable products

Within a reasonable life‐testing time, how to improve the reliability of highly reliable products is one of the great challenges to today's manufacturers. By using a resolution III experiment together with degradation test, Tseng, Hamada, and Chiao (1995) presented an interesting case study of improving the reliability of fluorescent lamps. However, in conducting such an experiment, they did not address the problem of how to choose the optimal settings of variables, such as sample size, inspection frequency, and termination time for each run, which are influential to the correct identification of significant factors and the experimental cost. Assuming that the product's degradation paths satisfy Wiener processes, this paper proposes a systematic approach to the aforementioned problem. First, an intuitively appealing identification rule is proposed. Next, under the constraints of a minimum probability of correct decision and a maximum probability of incorrect decision of the proposed identification rule, the optimum test plan (including the determinations of inspection frequency, sample size, and termination time for each run) can be obtained by minimizing the total experimental cost. An example is provided to illustrate the proposed method. © 2002 Wiley Periodicals, Inc. Naval Research Logistics 49: 514–526, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/nav.10024     

基于改进March SS算法的存储器测试技术研究

摘要：针对存储器的特点,介绍了存储器简化的功能故障模型．基于一种既可以测试静态简化故障又可以测试动态简化故障的MarchSS算法,提出了一种改进的存储器测试算法MarchSSI算法．该算法不仅能测出MarchSS算法测试的所有功能故障,而且能够覆盖MarchSS算法遗漏的故障,使算法故障覆盖率有了一定的提高．通过仿真,验证了算法的可行性．     

A note on defence spending in turkey: New findings

The relationship between defence spending and economic growth has been examined extensively in recent years using the Feder (1983) model. These studies suffer from poor statistical results. In this paper, the earlier findings of Sezgin (1997), which used the Feder model are re‐estimated. Firstly, the stationarity of variables is tested. Due to the non‐stationarity of some variables, regressions are performed using first differences of variables. Secondly, lags are introduced into the Feder model. The statistical results are highly improved. Not only is a strong positive association between defence spending and economic growth found for Turkey, but also human capital is positively correlated to Turkish economic growth with a lag.