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Today, many products are designed and manufactured to function for a long period of time before they fail. Determining product reliability is a great challenge to manufacturers of highly reliable products with only a relatively short period of time available for internal life testing. In particular, it may be difficult to determine optimal burn‐in parameters and characterize the residual life distribution. A promising alternative is to use data on a quality characteristic (QC) whose degradation over time can be related to product failure. Typically, product failure corresponds to the first passage time of the degradation path beyond a critical value. If degradation paths can be modeled properly, one can predict failure time and determine the life distribution without actually observing failures. In this paper, we first use a Wiener process to describe the continuous degradation path of the quality characteristic of the product. A Wiener process allows nonconstant variance and nonzero correlation among data collected at different time points. We propose a decision rule for classifying a unit as normal or weak, and give an economic model for determining the optimal termination time and other parameters of a burn‐in test. Next, we propose a method for assessing the product's lifetime distribution of the passed units. The proposed methodologies are all based only on the product's initial observed degradation data. Finally, an example of an electronic product, namely contact image scanner (CIS), is used to illustrate the proposed procedure. © 2002 Wiley Periodicals, Inc. Naval Research Logistics, 2003 相似文献
123.
Burn‐in is a technique to enhance reliability by eliminating weak items from a population of items having heterogeneous lifetimes. System burn‐in can improve system reliability, but the conditions for system burn‐in to be performed after component burn‐in remain a little understood mathematical challenge. To derive such conditions, we first introduce a general model of heterogeneous system lifetimes, in which the component burn‐in information and assembly problems are related to the prediction of system burn‐in. Many existing system burn‐in models become special cases and two important results are identified. First, heterogeneous system lifetimes can be understood naturally as a consequence of heterogeneous component lifetimes and heterogeneous assembly quality. Second, system burn‐in is effective if assembly quality variation in the components and connections which are arranged in series is greater than a threshold, where the threshold depends on the system structure and component failure rates. © 2003 Wiley Periodicals, Inc. Naval Research Logistics 50: 364–380, 2003. 相似文献
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孟凡生 《海军工程大学学报》2008,20(1):41-43
从合理性和科学性角度对复合成本计算过程中复合元数的设定进行了评价。运用模糊数学方法建立了评价矩阵,通过模糊合成使评价结果更加切合实际,解决了企业成本管理中复合元数判断的模糊性和不确定性问题,避免了复合成本计算过程中因复合元数设定不经济或简单化而出现的功能过剩或功能不足的现象出现。 相似文献
126.
本文在详细讨论特征结构提取问题的能量函数表示的基础上,通过对该能量函数表示的适当变换和整理,高阶关联非线性连续时间神经网络被引入到特征结构的提取问题中。这种方法直观、明了,它将所要提取的特征结构与网络稳定时的输出直接对应起来,可对特征结构进行自适应跟踪、估计,这为特征结构的提取提出了一个新的方法。 相似文献
127.
以往在评价和比较几个统计抽样方案时,多从比较分析两种风险率入手,由于这种方法的局限性,往往不能得出满意的结论。本文利用Bayes方法,在给出先验分布及有关损失函数的条件下,从各种抽样方案的平均总损失入手比较几个可选方案的优良性。本文提供的与二项分布相对应的算法具有一般意义。示例所得结果也是令人满意的。 相似文献
128.
谢政 《国防科技大学学报》1989,11(2):33-39
本文讨论了分段线性凸费用网络流问题,推广了线性费用网络流中的负回路方法和最小费用路方法,从而得到了求分段线性凸费用网络的最小费用流的两个算法。 相似文献
129.
兰侠 《军械工程学院学报》1989,(2)
本文提供了一种在弹药破片杀伤面积的估算中,求取微元内破片平均杀伤概率估值的新方法,这种方法可以保证在较小工作量的条件下提高估值精度. 相似文献
130.
We consider a two‐echelon inventory system with a manufacturer operating from a warehouse supplying multiple distribution centers (DCs) that satisfy the demand originating from multiple sources. The manufacturer has a finite production capacity and production times are stochastic. Demand from each source follows an independent Poisson process. We assume that the transportation times between the warehouse and DCs may be positive which may require keeping inventory at both the warehouse and DCs. Inventory in both echelons is managed using the base‐stock policy. Each demand source can procure the product from one or more DCs, each incurring a different fulfilment cost. The objective is to determine the optimal base‐stock levels at the warehouse and DCs as well as the assignment of the demand sources to the DCs so that the sum of inventory holding, backlog, and transportation costs is minimized. We obtain a simple equation for finding the optimal base‐stock level at each DC and an upper bound for the optimal base‐stock level at the warehouse. We demonstrate several managerial insights including that the demand from each source is optimally fulfilled entirely from a single distribution center, and as the system's utilization approaches 1, the optimal base‐stock level increases in the transportation time at a rate equal to the demand rate arriving at the DC. © 2011 Wiley Periodicals, Inc. Naval Research Logistics, 2011 相似文献