Estimating failure time distribution and its parameters based on intermediate data from a Wiener degradation model

Instead of measuring a Wiener degradation or performance process at predetermined time points to track degradation or performance of a product for estimating its lifetime, we propose to obtain the first‐passage times of the process over certain nonfailure thresholds. Based on only these intermediate data, we obtain the uniformly minimum variance unbiased estimator and uniformly most accurate confidence interval for the mean lifetime. For estimating the lifetime distribution function, we propose a modified maximum likelihood estimator and a new estimator and prove that, by increasing the sample size of the intermediate data, these estimators and the above‐mentioned estimator of the mean lifetime can achieve the same levels of accuracy as the estimators assuming one has failure times. Thus, our method of using only intermediate data is useful for highly reliable products when their failure times are difficult to obtain. Furthermore, we show that the proposed new estimator of the lifetime distribution function is more accurate than the standard and modified maximum likelihood estimators. We also obtain approximate confidence intervals for the lifetime distribution function and its percentiles. Finally, we use light‐emitting diodes as an example to illustrate our method and demonstrate how to validate the Wiener assumption during the testing. © 2008 Wiley Periodicals, Inc. Naval Research Logistics, 2008     

Optimum step‐stress accelerated life test plans for log‐location‐scale distributions

This article presents new tools and methods for finding optimum step‐stress accelerated life test plans. First, we present an approach to calculate the large‐sample approximate variance of the maximum likelihood estimator of a quantile of the failure time distribution at use conditions from a step‐stress accelerated life test. The approach allows for multistep stress changes and censoring for general log‐location‐scale distributions based on a cumulative exposure model. As an application of this approach, the optimum variance is studied as a function of shape parameter for both Weibull and lognormal distributions. Graphical comparisons among test plans using step‐up, step‐down, and constant‐stress patterns are also presented. The results show that depending on the values of the model parameters and quantile of interest, each of the three test plans can be preferable in terms of optimum variance. © 2008 Wiley Periodicals, Inc. Naval Research Logistics, 2008     

A model for step‐stress accelerated life testing

Modern technology is producing high reliability products. Life testing for such products under normal use condition takes a lot of time to obtain a reasonable number of failures. In this situation a step‐stress procedure is preferred for accelerated life testing. In this paper we assume a Weibull and Lognormal model whose scale parameter depends upon the present level as well as the age at the entry in the present stress level. On the basis of that we propose a parametric model to the life distribution for step‐stress testing and suggest a suitable design to estimate the parameters involved in the model. A simulation study has been done by the proposed model based on maximum likelihood estimation. © 2003 Wiley Periodicals, Inc. Naval Research Logistics, 2003     

Determination of burn‐in parameters and residual life for highly reliable products

Today, many products are designed and manufactured to function for a long period of time before they fail. Determining product reliability is a great challenge to manufacturers of highly reliable products with only a relatively short period of time available for internal life testing. In particular, it may be difficult to determine optimal burn‐in parameters and characterize the residual life distribution. A promising alternative is to use data on a quality characteristic (QC) whose degradation over time can be related to product failure. Typically, product failure corresponds to the first passage time of the degradation path beyond a critical value. If degradation paths can be modeled properly, one can predict failure time and determine the life distribution without actually observing failures. In this paper, we first use a Wiener process to describe the continuous degradation path of the quality characteristic of the product. A Wiener process allows nonconstant variance and nonzero correlation among data collected at different time points. We propose a decision rule for classifying a unit as normal or weak, and give an economic model for determining the optimal termination time and other parameters of a burn‐in test. Next, we propose a method for assessing the product's lifetime distribution of the passed units. The proposed methodologies are all based only on the product's initial observed degradation data. Finally, an example of an electronic product, namely contact image scanner (CIS), is used to illustrate the proposed procedure. © 2002 Wiley Periodicals, Inc. Naval Research Logistics, 2003     

压制火控系统中有关最大射程角的应用探讨

通过对实际应用中,压制火控系统射击诸元中有关最大射程角的具体使用进行了分析,提出了在地面压制武器系统外弹道中距离-射角函数可能出现多个极点的观点,并给出了最大射程角具体计算方法,在火控系统的工程实践中提高了武器系统的性能。     

Weibull型产品的可靠性验证

讨论了Weibull型产品的可靠性验证问题 ,首先分析了Weibull型产品分布参数的无信息验前分布问题 ,利用验前信息可以得到分布参数的验前概率密度函数 ,进而分析了产品的可靠性验证问题 ,顾及了使用方利益和生产方利益。仿真算例表明 ,使用方利益和生产方利益是相互折衷的。     

基于小波变换模极大值的自适应阈值图像去噪算法

依据白噪声小波变换性态与信号奇异性相比具有显著不同的特点,在大尺度下设置阈值,去掉噪声信号而保留图像细节信号引起的模极大值点。在阈值设置问题上,采用自适应阈值的方法,克服单一阈值不能在每级尺度上将信号与噪声作最大分离的缺点。实验表明,与单一阈值去噪方法相比,该方法不仅可以保留图像边缘信息,而且能提高去噪后图像的峰值信噪比2~5 dB。     

考虑可信度时导弹最大射程的Bayes评估

首先讨论了一种验前数据和现场试验数据相容性检验的新方法, 考虑验前信息可信度, 研究了导弹最大射程的 Ｂａｙｅｓ 评定和 Ｂａｙｅｓ 估计。最后给出了数据分析的例子。     

故障类别的模糊聚类分析

本文通过故障状态-特征的模糊聚类分析,按故障间的相似性对故障进行分类,然后按类别实施故障诊断,可在最少监测点的条件下,获得最多的设备运行故障信息。从而简化故障诊断过程,提高诊断速度和精度。     

人体静电极端值的分析研究

本文在讨论人体静电定义的基础上,分析各国报导人体静电极端值差异的原因,经理论分析和实验验证,给出人体静电电位的取值范围:10~(-2)～10~5V,并证明人体静电极端值60kV 是可信的.