Optimal design of accelerated life tests with two stresses

Most of the previous works on designing accelerated life test plans were concerned with the case where a single stress is employed for acceleration. In this article we develop optimal accelerated life test plans when two stresses are involved with possible interaction between them. The lifetimes of test items are assumed to follow an exponential distribution, the mean of which depends on the stresses according to the generalized Eyring law. A factorial arrangement of test points is considered for an efficient utilization of equipment, and the low level of each stress and the proportion of test items allocated to each test point are determined such that the asymptotic variance of the maximum-likelihood estimator of the mean lifetime at the use condition or of an acceleration factor is minimized. Patterns of optimal plans are identified and their efficiencies are compared with the corresponding single-stress accelerated life test plans. © 1996 John Wiley & Sons, Inc.     

Optimal design of accelerated life tests under periodic inspection

For the exponentially distributed lifetimes, optimal accelerated life test plans are determined under the assumptions of periodic inspection and Type I censoring. Computational results indicate that for the range of parameter values considered the asymptotic variance of the estimated mean or pth quantile at the use stress is not sensitive to the number of inspections at overstress levels. Senstivity analyses are also conducted to see how senstive the asymptotic variance of the estimated mean is with respect to the uncertainties involved in the guessed failure probabilities at the use and high stress levels. Computational results show that moderate deviations (several tens of percents) of the guessed failure probabilities from their true values are fairly tolerable in terms of the relative amount of increase in the asymptotic variance of the estimated mean. Procedures for selecting a sample size and for determining whether or not to conduct an accelerated life test are also discussed.     

Accelerated life test plans under intermittent inspection and type-I censoring: The case of weibull failure distribution

For the case where the lifetime at a stress level has a Weibull distribution, statistically optimal and practical accelerated life test plans are developed under the assumptions of intermittent inspection and Type-I censoring. For a statistically optimal plan the low stress level, the proportion of test units allocated, and the inspection times are determined such that the asymptotic variance of the maximum-likelihood estimator of a certain quantile at the use condition is minimized. Although the practical plan adopts the same design criterion, it involves three rather than two overstress levels and easily calculated inspection schemes. Despite some loss in efficiency the practical plan has several advantages over the statistically optimal one. For instance, the practical plan can provide means for checking the validity of the assumptions made, may reduce the danger of extrapolation, and is more convenient to determine and implement. Computational experiments are conducted to evaluate the relative efficiency of a practical plan to the corresponding statistically optimal plan. Guidelines for selecting an appropriate practical plan are also described with an example.