Global planning of accelerated degradation tests based on exponential dispersion degradation models |
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Authors: | I-Chen Lee Sheng-Tsaing Tseng Yili Hong |
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Institution: | 1. Department of Statistics, National Cheng Kung University, Tainan, Taiwan;2. Institute of Statistics, National Tsing Hua University, Hsinchu, Taiwan;3. Department of Statistics, Virginia Tech, Blacksburg, Virginia, USA |
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Abstract: | The accelerated degradation test (ADT) is an efficient tool for assessing the lifetime information of highly reliable products. However, conducting an ADT is very expensive. Therefore, how to conduct a cost-constrained ADT plan is a great challenging issue for reliability analysts. By taking the experimental cost into consideration, this paper proposes a semi-analytical procedure to determine the total sample size, testing stress levels, the measurement frequencies, and the number of measurements (within a degradation path) globally under a class of exponential dispersion degradation models. The proposed method is also extended to determine the global planning of a three-level compromise plan. The advantage of the proposed method not only provides better design insights for conducting an ADT plan, but also provides an efficient algorithm to obtain a cost-constrained ADT plan, compared with conventional optimal plans by grid search algorithms. |
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Keywords: | accelerated degradation tests cost constraints exponential dispersion degradation model optimal design |
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