Minimum cost sampling plans using bayesian methods

This article considers a general method for acceptance/rejection decisions in lot-by-lot sampling situations. Given arbitrary cost functions for sampling, accepting, and rejecting (where the cost can depend on the quality of the item) and a prior distribution on supplier quality, formulas are derived that lead to the minimal cost single-staged inspection plan. For the Bernoulli case, where each item is classified as acceptable or defective, the formulas simplify immensely. A computer code for solving the Bernoulli case is given.