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论软件缺陷
引用本文:宫云战. 论软件缺陷[J]. 装甲兵工程学院学报, 2003, 17(1): 60-63
作者姓名:宫云战
作者单位:装甲兵工程学院信息工程系,北京,100072
基金项目:总装技术基础资助项目和总装“十五”预研资助项目(41315050107)
摘    要:软件的缺陷是软件质量的重要因素之一,低缺陷密度的软件是高质量软件的必要条件。软件的缺陷是不可避免的,统计表明,经过PSP训练的软件工程师平均引入的缺陷密度为50个缺陷/kLOC。通过对软件缺陷概念及分类、产生缺陷的原因及如何避免产生缺陷、缺陷排除的分析和软件缺陷与软件故障率之间的关系的研究,探讨了如何研制低缺陷密度的软件。

关 键 词:软件缺陷  缺陷密度  缺陷排除  风险函数
修稿时间:2003-01-13

On Software's Defects
GONG Yun-zhan. On Software's Defects[J]. Journal of Armored Force Engineering Institute, 2003, 17(1): 60-63
Authors:GONG Yun-zhan
Affiliation:GONG Yun-zhan
Abstract:Software's defects are one of the important factors for software quality. Low defects density is necessary for high quality software. Software's defects are inevitable. Data shows that the average drawing defects density of software engineers after PSP training are 50 defects/KLOC. In this paper, discussed the concept and classification of software's defect, researched causes and how to avoid and remove detects, the aim of which were to reduce the drawing defects density. Finally, the relation between software's defects and software's reliability is discussed.
Keywords:software's defects  defects density  remove defects  hazard function  
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