| 反馈式内置自测试设计方案对比研究 |
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| 引用本文： | 李晓维.反馈式内置自测试设计方案对比研究[J].装甲兵工程学院学报,1996(3). |
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| 作者姓名： | 李晓维 |
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| 作者单位： | 北京大学计算机科学技木系 北京，100871 |
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| 摘 要： | 对两种基于反馈的自测试（BIST）方案进行了比较研究,给出了串行反馈和并行反馈BIST方案的设计结构和操作模式。分析了它们的状态转移图的拓扑结构,并对若干电路做了模拟实验。研究表明:添加线沟通测试图生成和响应压缩部分所产生的串行反馈BIST方案性能更好。
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| 关 键 词： | 测试 易测试设计 内置自测试 状态转移图 |
A Comparative Study of Feedback-Based BIST Schemes |
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| Li Xiaowei Dept. of Computer Science,Peking University,"Beijing ,China.A Comparative Study of Feedback-Based BIST Schemes[J].Journal of Armored Force Engineering Institute,1996(3). |
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| Authors: | Li Xiaowei Dept of Computer Science Peking University "Beijing China |
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| Institution: | Li Xiaowei Dept. of Computer Science,Peking University,"Beijing 100871,China |
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| Abstract: | This paper makes a comparative study for loop-based BIST schemes.The structures and operating modes of both serial and parallel feedback BIST schemes are presented.The typical STG topology of the two schemes are analyzed.Experimental results on some benchmark circuits are presented .Research shows that serial feedback BIST schemeperformances better. |
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| Keywords: | Tcsting Testable design Built-in Sclf-Test Statc TransitionGraph |
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