寿命试验持续时间的预测

工程界中诸多电子元器件的寿命都可以看作或近似看作是服从指数分布的,只有经寿命试验掌握各类电子元器件寿命的分布情况,才能对整个电子系统的可靠度有较充分的认识,从而对整个电子系统中的电子设备进行合理布局,优化控制,使其在实际应用中最大程度地发挥其作用。分别给出服从单参数指数分布的样本在寿命试验的早期结果上预测寿命试验的总持续时间的精确与近似方法的证明,并对两种预测方法在不同情况下的预测结果进行比较。

Prediction of Last Time of Life Test

A lot of electronic elements' life can be thought of or approximately be thought of from exponential distribution in engineering.The reliability of the electronic system can be known sufficiently only when the distribution of the life time about various electronic elements were grasped,thus these elements can produce their marked effect in large degree through be arranged rationally and be controlled optimally.The proofs of the exact and approximate methods using the early effect to predict the last time of life test from the exponential distribution of single parameter are given in this paper,and the two results in different condition are compared.