多退化模式下的电子装备可靠性建模

通常加速退化分析中退化失效只考虑或者假设只有一个退化通道,而实际上很多情况下会存在多退化模式.产品的各个退化通道间的关系存在随机性,即任意两个退化通道间不可能只是单一的相关或者独立.在考虑这种相关性的条件下,深入研究了电子产品的性能退化理论和机理,提出了两个多退化模式竞争失效的数学模型,分别阐述了退化通道相关与独立的两种不同情况下产品可靠度评估方法.

Electronic Equipments Reliability Modeling Research under Multi-degradation Mode

Usually only one degradation channel is considered in ordinarily accelerated degradation analysis. But actually Multi- degradation mode is existed. The relation of every degradation channel of the product may is random,each relation channel can't be only interrelated or independent. Considering of this relativity, the paper makes scientific researches on electronic equipments performance degradation theory and mechanism, gives an electronic equipments reliability evaluation model in multicenter instance, and an competition invalidation model under multi-mode interrelated.