Design of sequential sampling inspection plans with screening based on minimal lattice paths

In this article we propose new sequential sampling inspection plans with screening indexed by LTPD and AOQL, in which the alternative of accepting or rejecting a lot is decided by the results of sequential sampling plans, based on the minimal lattice paths. It is illustrated that the average total inspection can be economized by using both of the proposed sequential sampling inspection plans, with screening indexed by LTPD and AOQL, respectively. © 1994 John Wiley & Sons, Inc.