Two‐stage component test plans for testing the reliability of a series system

A system reliability is often evaluated by individual tests of components that constitute the system. These component test plans have advantages over complete system based tests in terms of time and cost. In this paper, we consider the series system with n components, where the lifetime of the i‐th component follows exponential distribution with parameter λ_i. Assuming test costs for the components are different, we develop an efficient algorithm to design a two‐stage component test plan that satisfies the usual probability requirements on the system reliability and in addition minimizes the maximum expected cost. For the case of prior information in the form of upper bounds on λ_i's, we use the genetic algorithm to solve the associated optimization problems which are otherwise difficult to solve using mathematical programming techniques. The two‐stage component test plans are cost effective compared to single‐stage plans developed by Rajgopal and Mazumdar. We demonstrate through several numerical examples that our approach has the potential to reduce the overall testing costs significantly. © 2002 John Wiley & Sons, Inc. Naval Research Logistics, 49: 95–116, 2002; DOI 10.1002/nav.1051     

Exact bayesian estimation of system reliability from component test data

System reliability is often estimated by the use of components' reliability test results when system test data are not available, or are very scarce. A method is proposed for computing the exact posterior probability density function, cumulative distribution function, and credible intervals for system reliability in a Bayesian setting, with the use of components' prior probability distributions and current test results. The method can be applied to series, parallel, and many mixed systems. Although in theory the method involves evaluating infinite series, numerical results show that a small number of terms from the infinite series are sufficient in practice to provide accurate estimates of system reliability. Furthermore, because the coefficients in the series follow some recurrence relations, our results allow us to calculate the reliability distribution of a large system from that of its subsystems. Error bounds associated with the proposed method are also given. Numerical comparisons with other existing approaches show that the proposed method is efficient and accurate. © 1997 John Wiley & Sons, Inc.     

A nonparametric Bayes approach to decide system burn-in time

Burn-in is the preconditioning of assemblies and the accelerated power-on tests performed on equipment subject to temperature, vibration, voltage, radiation, load, corrosion, and humidity. Burn-in techniques are widely applied to integrated circuits (IC) to enhance the component and system reliability. However, reliability prediction by burn-in at the component level, such as the one using the military (e.g., MIL-STD-280A, 756B, 217E [23–25]) and the industrial standards (e.g., the JEDEC standards), is usually not consistent with the field observations. Here, we propose system burn-in, which can remove many of the residual defects left from component and subsystem burn-in (Chien and Kuo [6]). A nonparametric model is considered because 1) the system configuration is usually very complicated, 2) the components in the system have different failure mechanisms, and 3) there is no good model for modeling incompatibility among components and subsystems (Chien and Kuo [5]; Kuo [16]). Since the cost of testing a system is high and, thus, only small samples are available, a Bayesian nonparametric approach is proposed to determine the system burn-in time. A case study using the proposed approach on MCM ASIC's shows that our model can be applied in the cases where 1) the tests and the samples are expensive, and 2) the records of previous generation of the products can provide information on the failure rate of the system under investigation. © 1997 John Wiley & Sons, Inc. Naval Research Logistics 44: 655–671, 1997     

Sequential determination of inspection epochs for reliability systems with general lifetime distributions

The problem of determining the optimal inspection epoch is studied for reliability systems in which N components operate in parallel. Lifetime distribution is arbitrary, but known. The optimization is carried with respect to two cost factors: the cost of inspecting a component and the cost of failure. The inspection epochs are determined so that the expected cost of the whole system per time unit per cycle will be minimized. The optimization process depends in the general case on the whole failure history of the system. This dependence is characterized. The cases of Weibull lifetime distributions are elaborated and illustrated numerically. The characteristics of the optimal inspection intervals are studied theoretically.     

An application of the MTP2 property on bounds on system reliability

This paper is concerned with the joint prior distribution of the dependent reliabilities of the components of a binary system. When this distribution is MTP₂ (Multivariate Totally Positive of Order 2), it is shown in general that this actually makes the machinery of Natvig and Eide [7] available to arrive at the posterior distribution of the system's reliability, based on data both at the component and system level. As an illustration in a common environmental stress case, the joint prior distribution of the reliabilities is shown to have the MTP₂ property. We also show, similarly to Gåsemyr and Natvig [3], for the case of independent components given component reliabilities how this joint prior distribution may be based on the combination of expert opinions. A specific system is finally treated numerically. © 1997 John Wiley & Sons, Inc. Naval Research Logistics 44: 741–755, 1997     

Evaluating methods for the reliability of a large 2‐dimensional rectangular k‐within‐consecutive‐(r,s)‐out‐of‐(m,n):F system

A 2‐dimensional rectangular k‐within‐consecutive‐(r, s)‐out‐of‐(m, n):F system consists of m × n components, and fails if and only if k or more components fail in an r × s submatrix. This system can be treated as a reliability model for TFT liquid crystal displays, wireless communication networks, etc. Although an effective method has been developed for evaluating the exact system reliability of small or medium‐sized systems, that method needs extremely high computing time and memory capacity when applied to larger systems. Therefore, developing upper and lower bounds and accurate approximations for system reliability is useful for large systems. In this paper, first, we propose new upper and lower bounds for the reliability of a 2‐dimensional rectangular k‐within‐consecutive‐(r, s)‐out‐of‐(m, n):F system. Secondly, we propose two limit theorems for that system. With these theorems we can obtain accurate approximations for system reliabilities when the system is large and component reliabilities are close to one. © 2005 Wiley Periodicals, Inc. Naval Research Logistics, 2005     

Optimal (τ, T) opportunistic maintenance of a k‐out‐of‐n:G system with imperfect PM and partial failure

The opportunistic maintenance of a k‐out‐of‐n:G system with imperfect preventive maintenance (PM) is studied in this paper, where partial failure is allowed. In many applications, the optimal maintenance actions for one component often depend on the states of the other components and system reliability requirements. Two new (τ, T) opportunistic maintenance models with the consideration of reliability requirements are proposed. In these two models, only minimal repairs are performed on failed components before time τ and the corrective maintenance (CM) of all failed components are combined with PM of all functioning but deteriorated components after τ; if the system survives to time T without perfect maintenance, it will be subject to PM at time T. Considering maintenance time, asymptotic system cost rate and availability are derived. The results obtained generalize and unify some previous research in this area. Application to aircraft engine maintenance is presented. © 2000 John Wiley & Sons;, Inc. Naval Research Logistics 47: 223–239, 2000     

On the reliability,availability and bayes confidence intervals for multicomponent systems

The problem of computing reliability and availability and their associated confidence limits for multi-component systems has appeared often in the literature. This problem arises where some or all of the component reliabilities and availabilities are statistical estimates (random variables) from test and other data. The problem of computing confidence limits has generally been considered difficult and treated only on a case-by-case basis. This paper deals with Bayes confidence limits on reliability and availability for a more general class of systems than previously considered including, as special cases, series-parallel and standby systems applications. The posterior distributions obtained are exact in theory and their numerical evaluation is limited only by computing resources, data representation and round-off in calculations. This paper collects and generalizes previous results of the authors and others. The methods presented in this paper apply both to reliability and availability analysis. The conceptual development requires only that system reliability or availability be probabilities defined in terms acceptable for a particular application. The emphasis is on Bayes Analysis and the determination of the posterior distribution functions. Having these, the calculation of point estimates and confidence limits is routine. This paper includes several examples of estimating system reliability and confidence limits based on observed component test data. Also included is an example of the numerical procedure for computing Bayes confidence limits for the reliability of a system consisting of N failure independent components connected in series. Both an exact and a new approximate numerical procedure for computing point and interval estimates of reliability are presented. A comparison is made of the results obtained from the two procedures. It is shown that the approximation is entirely sufficient for most reliability engineering analysis.     

Threshold optimization for weighted voting classifiers

Weighted voting classifiers considered in this paper consist of N units each providing individual classification decisions. The entire system output is based on tallying the weighted votes for each decision and choosing the one which has total support weight exceeding a certain threshold. Each individual unit may abstain from voting. The entire system may also abstain from voting if no decision support weight exceeds the threshold. Existing methods of evaluating the reliability of weighted voting systems can be applied to limited special cases of these systems and impose some restrictions on their parameters. In this paper a universal generating function method is suggested which allows the reliability of weighted voting classifiers to be exactly evaluated without imposing constraints on unit weights. Based on this method, the classifier reliability is determined as a function of a threshold factor, and a procedure is suggested for finding the threshold which minimizes the cost of damage caused by classifier failures (misclassification and abstention may have different price.) Dynamic and static threshold voting rules are considered and compared. A method of analyzing the influence of units' availability on the entire classifier reliability is suggested, and illustrative examples are presented. © 2003 Wiley Periodicals, Inc. Naval Research Logistics 50: 322–344, 2003.     

A minmax search for the critical level of a system: The asymmetric case

We consider a system composed of k components, each of which is subject to failure if temperature is above a critical level. The failure of one component causes the failure of the system as a whole (a serially connected system). If z_i is the critical temperature of the ith component then z^* = min{z_i: i = 1,2,…, k} is the critical level of the system. The components may be tested individually at different temperature levels, if the temperature is below the critical level the cost is $1, otherwise the test is destructive and the cost is m > 1 dollars. The purpose of this article is to construct, under a budgetary constraint, an efficient (in a minmax sense) testing procedure which will locate the critical level of the system with maximal accuracy.     

Variable sampling plans for normal distribution indexed by Taguchi's loss function

Taguchi has presented an approach to quality improvement in which reduction of deviation from the target value is the guiding principle. In this approach any measured value x of a product characteristic X brings a loss to consumer in general, where the loss is expressed as a quadratic form with respect to the difference between the measured value x and the target value T of a product characteristic. Then, it is natural to reject the lot which may bring a large loss to consumer. This concept induces us to construct new variable sampling plans based on the Taguchi's loss criterion. In this article, a design procedure of the sampling plans for assuring the loss in the Taguchi's method is proposed. Some numerical results based on the proposed design procedures are illustrated. © 1997 John Wiley & Sons, Inc. Naval Research Logistics 44: 591–603 (1997)     

Inference on a future reliability parameter with the weibull process model

An inferential procedure is presented which provides confidence intervals for a future reliability parameter when reliability growth testing is only partially completed. Hypothesis tests based on this method are uniformly most powerful unbiased. These results are applicable if (1) the system failure rate can be modeled as the intensity function of a Weibull process and (2) efforts to improve reliability are assumed to continue at a steady rate throughout the intervening period of testing. The usefulness of this methodology is illustrated by evaluating the risk of not reaching some future reliability milestone. If such risk is unacceptably high, program management may have time to identify problem areas and take corrective action before testing has ended. As a consequence, a more reliable system may be developed without incurring overruns in the scheduling or cost of the development program.     

软件构件可靠性与费用分配最优模型

针对软件构件可靠性和费用分配问题,给出一种可靠性和费用分配最优模型。文中将软件系统可靠性定义为软件构件失效密度、操作剖面、构件使用矩阵以及软件无失效运行时间的函数,描述了费用最优模型的建立和利用非线性规划理论求解模型的步骤,有效地处理了带有复杂计算的目标函数和约束条件的可靠性和费用最优分配问题。计算实例表明,利用该模型进行可靠性和费用分配是可行的。     

Note: Optimal allocation of resources to nodes of series systems with respect to failure-rate ordering

Allocation of spare components in a system in order to optimize the lifetime of the system with respect to a suitable criterion is of considerable interest in reliability, engineering, industry, and defense. We consider the problem of allocation of K active spares to a series system of independent and identical components in order to optimize the failure-rate function of the system. © 1997 John Wiley & Sons, Inc.     

Dynamic signatures and their use in comparing the reliability of new and used systems

The signature of a system with independent and identically distributed (i.i.d.) component lifetimes is a vector whose ith element is the probability that the ith component failure is fatal to the system. System signatures have been found to be quite useful tools in the study and comparison of engineered systems. In this article, the theory of system signatures is extended to versions of signatures applicable in dynamic reliability settings. It is shown that, when a working used system is inspected at time t and it is noted that precisely k failures have occurred, the vector s [0,1]^n‐k whose jth element is the probability that the (k + j)th component failure is fatal to the system, for j = 1,2,2026;,n ‐ k, is a distribution‐free measure of the design of the residual system. Next, known representation and preservation theorems for system signatures are generalized to dynamic versions. Two additional applications of dynamic signatures are studied in detail. The well‐known “new better than used” (NBU) property of aging systems is extended to a uniform (UNBU) version, which compares systems when new and when used, conditional on the known number of failures. Sufficient conditions are given for a system to have the UNBU property. The application of dynamic signatures to the engineering practice of “burn‐in” is also treated. Specifically, we consider the comparison of new systems with working used systems burned‐in to a given ordered component failure time. In a reliability economics framework, we illustrate how one might compare a new system to one successfully burned‐in to the kth component failure, and we identify circumstances in which burn‐in is inferior (or is superior) to the fielding of a new system. © 2009 Wiley Periodicals, Inc. Naval Research Logistics, 2009     

A dynamic model for component testing

We consider the component testing problem of a system where the main feature is that the component failure rates are not constant parameters, but they change in a dynamic fashion with respect to time. More precisely, each component has a piecewise-constant failure-rate function such that the lifetime distribution is exponential with a constant rate over local intervals of time within the overall mission time. There are several such intervals, and the rates change dynamically from one interval to another. We note that these lifetime distributions can also be used in a more general setting to approximate arbitrary lifetime distributions. The optimal component testing problem is formulated as a semi-infinite linear program. We present an algorithmic procedure to compute optimal test times based on the column-generation technique and illustrate it with a numerical example. © 1997 John Wiley & Sons, Inc. Naval Research Logistics 44: 187–197, 1997     

金属类MEMS器件可靠性试验技术研究

针对金属类MEMS机构可靠性水平较低且没有标准化的可靠性试验方法的现状,提出将强化试验方法引入金属类MEMS机构的可靠性研究中．确定强化试验的内容为温度循环、随机振动和冲击试验,并分别设计试验剖面．选取MEMS惯性开关作为典型器件开展试验研究,试验结果表明,所设计的可靠性试验能够有效激发MEMS机构的潜在缺陷,温度应力易引起MEMS器件层间产生疲劳效应,而振动和冲击应力则易引发器件结构性损坏;环境应力对MEMS机构具有疲劳累积效应,经历较多试验类型的样本较经历较少试验类型的样本更容易失效;惯性开关的主要失效模式是分层和变形,这2种失效模式在金属类MEMS机构中具有代表性．     

构件式遥感信息处理系统的设计

随着遥感技术在国民经济和国防等领域的广泛应用，各种用户也逐渐对遥感数据的管理和处理提出了越来越多的要求。传统的遥感信息处理系统面临着严峻的挑战。构件软件技术作为目前发展最快的软件重用技术，是降低软件开发费用，提高软件生产效率和系统的可靠性、可维护性、可扩展性的有效方法。本文介绍了一个遥感信息处理系统，阐述了它的基于构件软件体系结构的开发思想及其特点。     

Warranty analysis and renewal function estimation

Estimation of the expected cost of a warranty for a stochastically failing unit is closely tied to estimation of the renewal function. The renewal function is a basic tool also used in probabilistic models arising in other areas such as reliability theory, inventory theory, and continuous sampling plans. In these other areas, estimation of a straight line approximation of the renewal function instead of direct estimation of the renewal function has proved successful. This approximation is based on a limit expression for large values of the argument, say t, of the renewal function. However, in warranty analusis, typically t is small compared to the mean failure time of the unit. Hence, alternative methods for renewal function estimation, both parametric and nonparametric, are presented and discussed. An important aspect of this paper is to discuss the performance of the renewal function estimators when only a small number of failed units is available. A Monte Carlo study is given which suggests guidelines for choosing an estimator under various circumstances.     

A heuristic algorithm for determining replacement policies in k-out-of-n systems

The authors study a discrete-time, infinite-horizon, dynamic programming model for the replacement of components in a binary k-out-of-n failure system. (The system fails when k or more of its n components fail.) Costs are incurred when the system fails and when failed components are replaced. The objective is to minimize the long-run expected average undiscounted cost per period. A companion article develops a branch-and-bound algorithm for computing optimal policies. Extensive computational experiments find it effective for k to be small or near n; however, difficulties are encountered when n ≥ 30 and 10 ≤ k ≤ n − 4. This article presents a simple, intuitive heuristic rule for determining a replacement policy whose memory storage and computation time requirements are O(n − k) and O(n(n − k) + k), respectively. This heuristic is based on a plausible formula for ranking components in order of their usefulness. The authors provide sufficient conditions for it to be optimal and undertake computational experiments that suggest that it handles parallel systems (k = n) effectively and, further, that its effectiveness increases as k moves away from n. In our test problems, the mean relative errors are under 5% when n ≤ 100 and under 2% when k ≤ n − 3 and n ≤ 50. © 1997 John Wiley & Sons, Inc. Naval Research Logistics 44, 273–286, 1997.