A minmax search for the critical level of a system: The asymmetric case

We consider a system composed of k components, each of which is subject to failure if temperature is above a critical level. The failure of one component causes the failure of the system as a whole (a serially connected system). If z_i is the critical temperature of the ith component then z^* = min{z_i: i = 1,2,…, k} is the critical level of the system. The components may be tested individually at different temperature levels, if the temperature is below the critical level the cost is $1, otherwise the test is destructive and the cost is m > 1 dollars. The purpose of this article is to construct, under a budgetary constraint, an efficient (in a minmax sense) testing procedure which will locate the critical level of the system with maximal accuracy.