基于复合失效模式的寿命分布检验方法

产品往往受随机失效和耗损失效两种模式的双重影响,因此,构造指数威布尔分布表征该类产品的失效规律。首先,用图检验法对该类产品的寿命数据进行初步检验;其次,研究了该类产品寿命数据的极大似然估计的求解方法,进一步用伽方检验方法对寿命分布类进行了检验;最后,通过工程仿真例子说明了该方法的具体操作流程,最终验证了方法的正确性。     

维护条件下产品寿命分布规律分析

为了掌握维护条件下产品寿命分布规律,进一步解释其失效特性,从维护条件下产品性能状态变化角度出发,结合累积失效理论,利用复合Poisson过程建立了可靠性模型,得到了该条件下产品在线寿命分布模型。在此基础上,建立了维护条件下产品总体寿命分布模型,并利用偏度-峰度系数和贴近度分析,对维护条件下产品在线寿命分布和总体寿命分布规律进行了数值计算,解释了工程产品在线往往具有集中失效,而总体又具有随机失效的特性。以水泵转子为研究对象,通过数值分析,较好地描述了其定期维护条件下的可靠度和寿命分布,进一步验证了模型的可行性。     

软体油罐储存失效概率分布加速寿命试验研究

随着储存和使用年限的增长,受环境应力的影响,软体油罐各项性能指标均出现不同程度的下降。对软体油罐进行寿命评估对于合理确定油罐的报废周期,开展新型罐体材料研究具有一定的指导意义。以软体油罐模型为试验材料,以气密性测试为失效判别标准,通过加速寿命试验,得到样本在110℃老化温度下的失效数据,并通过威布尔概率图检验法和Van Montfort检验法对失效数据进行检验,得到软体油罐失效概率服从威布尔分布的结论,为软体油罐可靠性寿命评估奠定了理论基础。     

性能退化与寿命数据融合的贝叶斯方法研究

针对高可靠性航空产品寿命失效数据样本量小,传统评估方法可信度低的难题,提出基于性能退化数据与寿命失效数据融合的可靠性评估方法。然后用失效机理分析、建模方法选择、失效阀值确定、置信区间求解和数据融合5个关键步骤具体阐述了该方法。最后以飞机液压泵为例,使用该方法进行性能退化数据与寿命数据的融合计算。分析表明,该方法充分利用了性能数据和寿命数据,比传统的方法更加合理,评估结果更加精确。     

考虑外场差异的步进加速寿命数据可靠性评估方法

针对寿命服从双参数Weibull分布的机电产品,进行单应力、定时转换的步进加速寿命试验,研究加速寿命试验数据下的可靠性评估问题。考虑到外场多应力环境与实验室单一应力环境之间的差异性,构建基于修正系数的分布参数计算模型;开展步进加速寿命试验过程的统计分析,建立各应力下的累计分布函数关系;构建极大似然函数,运用数值迭代法,求解未知参数估计;结合某型机电产品进行仿真方案设计,采用Monte Carlo仿真方法产生样本数据,通过对比分析说明所提出的模型评估精度更高。     

三参数威布尔分布在寿命分析中的参数估计

威布尔分布在可靠性工程中已得到了广泛的应用.在对己给定的寿命试验数据进行可靠性分析与评估中,因简单易解多采用二参数威布尔分布,但参数估计会带来较大误差.对具有以损耗失效为特征的某些机械零部件,采用三参数威布尔分布进行拟合及参数估计,可以得到更高的精度,因而较二参数威布尔分布,更能反映产品可靠性的实际情况.     

步进加速退化试验及其在电子产品可靠性评估中的应用

为快速评估具有高可靠、长寿命特点的电子产品的可靠性，提出了使用步进加速退化试验技术的方法。文中首先给出了步进加速退化的试验方法及基本假设，然后给出了步进退化数据向恒加退化数据的折算方法，在此基础上提出了基于伪失效寿命的步进加速退化可靠性评估算法，最后利用试验数据对该方法进行了验证。该方法与恒加退化试验相比，在保持样本量不变的基础上，可以极大地缩短试验时间，因此，具有更高的效费比。     

基于伪寿命分布的退化数据可靠性评估方法

为更好地对高可靠、长寿命的产品进行可靠性评估,对加速退化试验进行了分析研究。首先,提出了建立退化轨迹的基本流程方法;其次,对加速退化数据的处理方法进行了分析;最后,用一个实例验证了方法的有效性。     

基于步进加速寿命试验的制导弹药储存寿命评估

介绍步进应力加速寿命试验原理,通过对制导弹药自动导引头贮存状态和失效机理的分析,确定了加速寿命试验应力和应力水平．假设产品寿命服从威布尔分布,应用极大似然估计和Bayes的方法处理数据,建立制导弹药可靠储存寿命预测模型,并计算得到自动导引头在正常应力水平下的可靠储存寿命．     

存在工作历程产品的加速寿命试验统计分析

加速寿命试验(ALT)可在较短时间内获得产品的寿命及可靠性信息.利用ALT对产品的剩余寿命进行评估时,常常将已工作过的产品进行抽样并投入试验,在这一类样本的ALT数据统计分析时如何处理初始工作时间,成为ALT应用中的一个重要问题.工程实际中评估此类样本的剩余寿命时常常忽略初始工作时间,将其视为"用后如新"或"无记忆性"产品.但此假设必须以产品寿命服从指数分布为前提,而大部分机电产品的寿命服从Weibull分布,因而该方法在应用时必然会产生较大误差.针对这一问题提出了一种新的基于时间折算的ALT数据统计分析方法,并利用Monte Carlo仿真对其估计特性进行对比研究,结果表明此方法能有效评估存在初始工作历程产品的剩余寿命,估计精度优于原方法.     

Determination of burn‐in parameters and residual life for highly reliable products

Today, many products are designed and manufactured to function for a long period of time before they fail. Determining product reliability is a great challenge to manufacturers of highly reliable products with only a relatively short period of time available for internal life testing. In particular, it may be difficult to determine optimal burn‐in parameters and characterize the residual life distribution. A promising alternative is to use data on a quality characteristic (QC) whose degradation over time can be related to product failure. Typically, product failure corresponds to the first passage time of the degradation path beyond a critical value. If degradation paths can be modeled properly, one can predict failure time and determine the life distribution without actually observing failures. In this paper, we first use a Wiener process to describe the continuous degradation path of the quality characteristic of the product. A Wiener process allows nonconstant variance and nonzero correlation among data collected at different time points. We propose a decision rule for classifying a unit as normal or weak, and give an economic model for determining the optimal termination time and other parameters of a burn‐in test. Next, we propose a method for assessing the product's lifetime distribution of the passed units. The proposed methodologies are all based only on the product's initial observed degradation data. Finally, an example of an electronic product, namely contact image scanner (CIS), is used to illustrate the proposed procedure. © 2002 Wiley Periodicals, Inc. Naval Research Logistics, 2003     

Priori information analysis of optocoupler accelerated degradation experiment based on failure mechanism verification test

The optocoupler is a weak link in the inertial navigation platform of a kind of guided munitions. It is necessary to use accelerated storage test to verify the storage life of long storage products. Especially for small sample products, it is very important to obtain prior information for the design and implementation of accelerated degradation test. In this paper, the optocoupler failure mechanism verification test is designed and the experimental results are analyzed and the prior information is obtained. The results show that optocouplers have two failure modes, one is sudden failure and the other is degradation failure; the maximum temperature stress of optocoupler can't exceed 140 °C; the increase of leakage current of optocoupler is caused by movable ions contaminating the LED chip. The surface leakage current is proportional to the adsorption amount. The increase of leakage current makes p-n junction tunneling effect occur which LEDs the failure of the optocoupler. The lifetime distribution model of the optocoupler is determined by the failure physics. The lifetime of the optocoupler is subject to the lognormal distribution. The degeneracy orbit of the optocoupler leakage current is described by a power law model. The estimated values of the orbital parameters are initially calculated and the parameters of its life distribution function are deduced. The above information lays a good foundation for the optimization design and data processing of the accelerated degradation experiment.     

Planning accelerated life tests for censored two‐parameter exponential distributions

We consider optimal test plans involving life distributions with failure‐free life, i.e., where there is an unknown threshold parameter below which no failure will occur. These distributions do not satisfy the regularity conditions and thus the usual approach of using the Fisher information matrix to obtain an optimal accelerated life testing (ALT) plan cannot be applied. In this paper, we assume that lifetime follows a two‐parameter exponential distribution and the stress‐life relationship is given by the inverse power law model. Near‐optimal test plans for constant‐stress ALT under both failure‐censoring and time‐censoring are obtained. We first obtain unbiased estimates for the parameters and give the approximate variance of these estimates for both failure‐censored and time‐censored data. Using these results, the variance for the approximate unbiased estimate of a percentile at a design stress is computed and then minimized to produce the near‐optimal plan. Finally, a numerical example is presented together with simulation results to study the accuracy of the approximate variance given by the proposed plan and show that it outperforms the equal‐allocation plan. © 1999 John Wiley & Sons, Inc. Naval Research Logistics 46: 169–186, 1999     

自动武器可靠性寿命分布规律研究

本文对两种具有代表性的自动武器收集其生产验收寿命试验的故障记录,经处理得出寿命子样,再用皮尔逊检验进行分布函数检验,从中发现自动武器寿命分布服从指数分布,为研究自动武器可靠性指标及其验收方法提供了理论依据。     

基于贝叶斯方法的退化失效型产品实时可靠性评估

通过传统可靠性方法得到的失效分布反映了相同受试环境下同一类产品的平均特征,并不能直接应用于系统实时定量可靠性分析。为此,针对有历史试验数据的退化失效型产品,依据局部更新的思想,利用贝叶斯方法最大可能地采用现场测试数据,并将之及时反映到实时可靠性模型中去。结果表明,随着融合现场数据的增多,产品的实时可靠性模型也逐渐全面反映出产品的个性特征。     

When are observed failures more informative than observed survivals?

A framework involving independent competing risks permits observing failures due to a specific cause and failures due to a competing cause, which constitute survival times from the cause of primary interest. Is observing more failures more informative than observing survivals? Intuitively, due to the definitiveness of failures, the answer seems to be the former. However, it has been shown before that this intuition holds when estimating the mean but not the failure rate of the exponential model with a gamma prior distribution for the failure rate. In this article, we address this question at a more general level. We show that for a certain class of distributions failures can be more informative than survivals for prediction of life length and vice versa for some others. We also show that for a large class of lifetime models, failure is less informative than survival for estimating the proportional hazards parameter with gamma, Jeffreys, and uniform priors. We further show that, for this class of lifetime models, on average, failure is more informative than survival for parameter estimation and for prediction. These results imply that the inferential purpose and properties of the lifetime distribution are germane for conducting life tests. © 2013 Wiley Periodicals, Inc. Naval Research Logistics, 2013     

成败型产品验收试验方案研究

在可靠性定型试验的基础上,利用多层贝叶斯方法确定批产品可靠性指标的先验分布,从而制定出成败型产品可靠性验收试验的一种贝叶斯方案.给出利用定型试验信息确定产品可靠性指标先验分布的方法.这种验收方法充分利用了产品定型试验中的先验信息,在确保有较好验收效果的前提下,与传统的验收试验相比,可以大大减少试验量,从而得到可观的经济效益.