Estimating failure time distribution and its parameters based on intermediate data from a Wiener degradation model

Instead of measuring a Wiener degradation or performance process at predetermined time points to track degradation or performance of a product for estimating its lifetime, we propose to obtain the first‐passage times of the process over certain nonfailure thresholds. Based on only these intermediate data, we obtain the uniformly minimum variance unbiased estimator and uniformly most accurate confidence interval for the mean lifetime. For estimating the lifetime distribution function, we propose a modified maximum likelihood estimator and a new estimator and prove that, by increasing the sample size of the intermediate data, these estimators and the above‐mentioned estimator of the mean lifetime can achieve the same levels of accuracy as the estimators assuming one has failure times. Thus, our method of using only intermediate data is useful for highly reliable products when their failure times are difficult to obtain. Furthermore, we show that the proposed new estimator of the lifetime distribution function is more accurate than the standard and modified maximum likelihood estimators. We also obtain approximate confidence intervals for the lifetime distribution function and its percentiles. Finally, we use light‐emitting diodes as an example to illustrate our method and demonstrate how to validate the Wiener assumption during the testing. © 2008 Wiley Periodicals, Inc. Naval Research Logistics, 2008     

Optimal pricing for a short life‐cycle product when customer price‐sensitivity varies over time

Technology products often experience a life‐cycle demand pattern that resembles a diffusion process, with weak demand in the beginning and the end of the life cycle and high demand intensity in between. The customer price‐sensitivity also changes over the life cycle of the product. We study the prespecified pricing decision for a product that exhibits such demand characteristics. In particular, we determine the optimal set of discrete prices and the times to switch from one price to another, when a limited number of price changes are allowed. Our study shows that the optimal prices and switching times show interesting patterns that depend on the product's demand pattern and the change in the customers' price sensitivity over the life cycle of the product. © 2012 Wiley Periodicals, Inc. Naval Research Logistics, 2012     

Designing a screening experiment for highly reliable products

Within a reasonable life‐testing time, how to improve the reliability of highly reliable products is one of the great challenges to today's manufacturers. By using a resolution III experiment together with degradation test, Tseng, Hamada, and Chiao (1995) presented an interesting case study of improving the reliability of fluorescent lamps. However, in conducting such an experiment, they did not address the problem of how to choose the optimal settings of variables, such as sample size, inspection frequency, and termination time for each run, which are influential to the correct identification of significant factors and the experimental cost. Assuming that the product's degradation paths satisfy Wiener processes, this paper proposes a systematic approach to the aforementioned problem. First, an intuitively appealing identification rule is proposed. Next, under the constraints of a minimum probability of correct decision and a maximum probability of incorrect decision of the proposed identification rule, the optimum test plan (including the determinations of inspection frequency, sample size, and termination time for each run) can be obtained by minimizing the total experimental cost. An example is provided to illustrate the proposed method. © 2002 Wiley Periodicals, Inc. Naval Research Logistics 49: 514–526, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/nav.10024     

Equivalent accelerated life testing plans for log‐location‐scale distributions

Accelerated life testing (ALT) is widely used to determine the failure time distribution of a product and the associated life‐stress relationship in order to predict the product's reliability under normal operating conditions. Many types of stress loadings such as constant‐stress, step‐stress and cyclic‐stress can be utilized when conducting ALT. Extensive research has been conducted on the analysis of ALT data obtained under a specified stress loading. However, the equivalency of ALT experiments involving different stress loadings has not been investigated. In this article, a log‐location‐scale distribution under Type I censoring is considered in planning ALT. An idea is provided for the equivalency of various ALT plans involving different stress loadings. Based on this idea, general equivalent ALT plans and some special types of equivalent ALT plans are explored. For demonstration, a constant‐stress ALT and a ramp‐stress ALT for miniature lamps are presented and their equivalency is investigated. © 2010 Wiley Periodicals, Inc. Naval Research Logistics, 2010     

Bounding the optimal burn‐in time for a system with two types of failure

Burn‐in is a widely used method to improve the quality of products or systems after they have been produced. In this paper, we consider the problem of determining bounds to the optimal burn‐in time and optimal replacement policy maximizing the steady state availability of a repairable system. It is assumed that two types of system failures may occur: One is Type I failure (minor failure), which can be removed by a minimal repair, and the other is Type II failure (catastrophic failure), which can be removed only by a complete repair. Assuming that the underlying lifetime distribution of the system has a bathtub‐shaped failure rate function, upper and lower bounds for the optimal burn‐in time are provided. Furthermore, some other applications of optimal burn‐in are also considered. © 2004 Wiley Periodicals, Inc. Naval Research Logistics, 2004     

Optimal burn‐in procedure for periodically inspected systems

Burn‐in is a widely used method to improve the quality of products or systems after they have been produced. In this paper, we study burn‐in procedure for a system that is maintained under periodic inspection and perfect repair policy. Assuming that the underlying lifetime distribution of a system has an initially decreasing and/or eventually increasing failure rate function, we derive upper and lower bounds for the optimal burn‐in time, which maximizes the system availability. Furthermore, adopting an age replacement policy, we derive upper and lower bounds for the optimal age parameter of the replacement policy for each fixed burn‐in time and a uniform upper bound for the optimal burn‐in time given the age replacement policy. These results can be used to reduce the numerical work for determining both optimal burn‐in time and optimal replacement policy. © 2007 Wiley Periodicals, Inc. Naval Research Logistics, 2007     

A stochastic model for burn‐in procedures in accelerated environment

Burn‐in procedure is a manufacturing technique that is intended to eliminate early failures of system or product. Burning‐in a component or system means to subject it to a period of use prior to being used in field. Generally, burn‐in is considered expensive and so the length of burn‐in is typically limited. Thus, burn‐in is most often accomplished in an accelerated environment in order to shorten the burn‐in process. A new failure rate model for an accelerated burn‐in procedure, which incorporates the accelerated ageing process induced by the accelerated environmental stress, is proposed. Under a more general assumption on the shape of failure rate function of products, which includes the traditional bathtub‐shaped failure rate function as a special case, upper bounds for optimal burn‐in time will be derived. A numerical example will also be given for illustration. © 2006 Wiley Periodicals, Inc. Naval Research Logistics, 2006     

不确定失效阈值影响下考虑设备剩余寿命预测信息的最优替换策略

为了进一步提升设备维修决策的科学性,通过建立综合设备剩余寿命预测数据与不确定失效阈值的最优维修决策模型,实现了不可维修设备的最优替换策略。构建基于非线性Wiener过程的设备性能退化模型,并采用极大似然法估计退化模型参数;提出一种基于期望最大(Expectation Maximization, EM)算法的不确定失效阈值分布系数估计方法,通过引入虚拟失效阈值数据实现对失效阈值分布系数的同步迭代更新;基于首达时的概念推导出不确定失效阈值条件下设备剩余寿命的概率密度函数,并基于更新报酬理论建立维修决策模型,从而实现设备的最优维修决策。算例分析表明,设备的失效阈值会对维修决策结果产生重要影响,考虑设备失效阈值的不确定性既有助于提升剩余寿命预测的准确性,又可以有效降低设备的寿命周期费用。     

Competing with channel partners: Supply chain conflict when retailers introduce store brands

Private‐label products are of increasing importance in many retail categories. While national‐brand products are designed by the manufacturer and sold by the retailer, the positioning of store‐brand products is under the complete control of the retailer. We consider a scenario where products differ on a performance quality dimension and we analyze how retailer–manufacturer interactions in product positioning are affected by the introduction of a private‐label product. Specifically, we consider a national‐brand manufacturer who determines the quality of its product as well the product's wholesale price charged to the retailer. Given the national‐brand quality and wholesale price, the retailer then decides the quality level of its store brand and sets the retail prices for both products. We find that a manufacturer can derive substantial benefits from considering a retailer's store‐brand introduction when determining the national brand's quality and wholesale price. If the retailer has a significant cost disadvantage in producing high‐quality products, the manufacturer does not need to adjust the quality of the national‐brand product, but he should offer a wholesale price discount to ensure its distribution through the retailer. If the retailer is competitive in providing products of high‐quality, the manufacturer should reduce this wholesale price discount and increase the national‐brand quality to mitigate competition. Interestingly, we find the retailer has incentive to announce a store‐brand introduction to induce the manufacturer's consideration of these plans in determining the national‐brand product quality and wholesale price. © 2010 Wiley Periodicals, Inc. Naval Research Logistics, 2010     

基于复合失效模式的寿命分布检验方法

产品往往受随机失效和耗损失效两种模式的双重影响,因此,构造指数威布尔分布表征该类产品的失效规律。首先,用图检验法对该类产品的寿命数据进行初步检验;其次,研究了该类产品寿命数据的极大似然估计的求解方法,进一步用伽方检验方法对寿命分布类进行了检验;最后,通过工程仿真例子说明了该方法的具体操作流程,最终验证了方法的正确性。     

Dynamic coordination of production planning and sales admission control in the presence of a spot market

We consider the decision‐making problem of dynamically scheduling the production of a single make‐to stock (MTS) product in connection with the product's concurrent sales in a spot market and a long‐term supply channel. The spot market is run by a business to business (B2B) online exchange, whereas the long‐term channel is established by a structured contract. The product's price in the spot market is exogenous, evolves as a continuous time Markov chain, and affects demand, which arrives sequentially as a Markov‐modulated Poisson process (MMPP). The manufacturer is obliged to fulfill demand in the long‐term channel, but is able to rein in sales in the spot market. This is a significant strategic decision for a manufacturer in entering a favorable contract. The profitability of the contract must be evaluated by optimal performance. The current problem, therefore, arises as a prerequisite to exploring contracting strategies. We reveal that the optimal strategy of coordinating production and sales is structured by the spot price dependent on the base stock and sell‐down thresholds. Moreover, we can exploit the structural properties of the optimal strategy to conceive an efficient algorithm. © 2010 Wiley Periodicals, Inc. Naval Research Logistics, 2010     

考虑非线性退化与随机失效阈值的剩余寿命预测

针对广泛存在的非线性退化设备,现有方法尚未考虑随机失效阈值对剩余寿命预测结果的影响。因此,通过对设备性能退化过程进行分析,提出了一种综合考虑非线性退化与随机失效阈值的剩余寿命预测方法。基于Wiener过程构建了考虑个体差异与测量误差的非线性退化模型;基于卡尔曼滤波算法建立状态空间模型以实现对退化状态的在线更新;基于极大似然法估计失效阈值分布系数估计方法,得到随机失效阈值的概率分布;基于随机失效阈值推导出剩余寿命的概率分布,实现对剩余寿命的在线预测。算例研究表明,所提方法可以有效地提升剩余寿命预测的准确性,具备一定工程应用价值。     

Planning gamma accelerated degradation tests with two accelerating variables

Gamma accelerated degradation tests (ADT) are widely used to assess timely lifetime information of highly reliable products with degradation paths that follow a gamma process. In the existing literature, there is interest in addressing the problem of deciding how to conduct an efficient, ADT that includes determinations of higher stress‐testing levels and their corresponding sample‐size allocations. The existing results mainly focused on the case of a single accelerating variable. However, this may not be practical when the quality characteristics of the product have slow degradation rates. To overcome this difficulty, we propose an analytical approach to address this decision‐making problem using the case of two accelerating variables. Specifically, based on the criterion of minimizing the asymptotic variance of the estimated q quantile of lifetime distribution of the product, we analytically show that the optimal stress levels and sample‐size allocations can be simultaneously obtained via a general equivalence theorem. In addition, we use a practical example to illustrate the proposed procedure.     

Priori information analysis of optocoupler accelerated degradation experiment based on failure mechanism verification test

The optocoupler is a weak link in the inertial navigation platform of a kind of guided munitions. It is necessary to use accelerated storage test to verify the storage life of long storage products. Especially for small sample products, it is very important to obtain prior information for the design and implementation of accelerated degradation test. In this paper, the optocoupler failure mechanism verification test is designed and the experimental results are analyzed and the prior information is obtained. The results show that optocouplers have two failure modes, one is sudden failure and the other is degradation failure; the maximum temperature stress of optocoupler can't exceed 140 °C; the increase of leakage current of optocoupler is caused by movable ions contaminating the LED chip. The surface leakage current is proportional to the adsorption amount. The increase of leakage current makes p-n junction tunneling effect occur which LEDs the failure of the optocoupler. The lifetime distribution model of the optocoupler is determined by the failure physics. The lifetime of the optocoupler is subject to the lognormal distribution. The degeneracy orbit of the optocoupler leakage current is described by a power law model. The estimated values of the orbital parameters are initially calculated and the parameters of its life distribution function are deduced. The above information lays a good foundation for the optimization design and data processing of the accelerated degradation experiment.     

Resource allocation with lumpy demand: To speed or not to speed?

In the classical EPQ model with continuous and constant demand, holding and setup costs are minimized when the production rate is no larger than the demand rate. However, the situation may change when demand is lumpy. We consider a firm that produces multiple products, each having a unique lumpy demand pattern. The decision involves determining both the lot size for each product and the allocation of resources for production rate improvements among the products. We find that each product's optimal production policy will take on only one of two forms: either continuous production or lot‐for‐lot production. The problem is then formulated as a nonlinear nonsmooth knapsack problem among products determined to be candidates for resource allocation. A heuristic procedure is developed to determine allocation amounts. The procedure decomposes the problem into a mixed integer program and a nonlinear convex resource allocation problem. Numerical tests suggest that the heuristic performs very well on average compared to the optimal solution. Both the model and the heuristic procedure can be extended to allow the company to simultaneously alter both the production rates and the incoming demand lot sizes through quantity discounts. Extensions can also be made to address the case where a single investment increases the production rate of multiple products. © 2004 Wiley Periodicals, Inc. Naval Research Logistics, 2004.     

Shortest path interdiction problem with arc improvement recourse: A multiobjective approach

We consider the shortest path interdiction problem involving two agents, a leader and a follower, playing a Stackelberg game. The leader seeks to maximize the follower's minimum costs by interdicting certain arcs, thus increasing the travel time of those arcs. The follower may improve the network after the interdiction by lowering the costs of some arcs, subject to a cardinality budget restriction on arc improvements. The leader and the follower are both aware of all problem data, with the exception that the leader is unaware of the follower's improvement budget. The effectiveness of an interdiction action is given by the length of a shortest path after arc costs are adjusted by both the interdiction and improvement. We propose a multiobjective optimization model for this problem, with each objective corresponding to a different possible improvement budget value. We provide mathematical optimization techniques to generate a complete set of strategies that are Pareto‐optimal. Additionally, for the special case of series‐parallel graphs, we provide a dynamic‐programming algorithm for generating all Pareto‐optimal solutions.     

基于维纳过程金属化膜电容器的剩余寿命预测

金属化膜电容器是惯性约束聚变激光装置能源系统最重要的元器件,对个体电容器的剩余寿命进行有效的预测对整个装置的可靠性水平有着重要的影响.为有效地预测个体电容器的剩余寿命,提出了融合单个电容器性能退化数据与先验性能退化数据信息的预测方法.采用Wiener过程对其性能退化过程进行建模,并根据先验退化数据信息构造参数的先验分布...     

An adaptive forecasting algorithm and inventory policy for products with short life cycles

Products with short life cycles are becoming increasingly common in many industries, such as the personal computer (PC) and mobile phone industries. Traditional forecasting methods and inventory policies can be inappropriate for forecasting demand and managing inventory for a product with a short life cycle because they usually do not take into account the characteristics of the product life cycle. This can result in inaccurate forecasts, high inventory cost, and low service levels. Besides, many forecasting methods require a significant demand history, which is available only after the product has been sold for some time. In this paper, we present an adaptive forecasting algorithm with two characteristics. First, it uses structural knowledge on the product life cycle to model the demand. Second, it combines knowledge on the demand that is available prior to the launch of the product with actual demand data that become available after the introduction of the product to generate and update demand forecasts. Based on the forecasting algorithm, we develop an optimal inventory policy. Since the optimal inventory policy is computationally expensive, we propose three heuristics and show in a numerical study that one of the heuristics generates near‐optimal solutions. The evaluation of our approach is based on demand data from a leading PC manufacturer in the United States, where the forecasting algorithm has been implemented. © 2004 Wiley Periodicals, Inc. Naval Research Logistics, 2004.     

Comparison between constant‐stress and step‐stress accelerated life tests under Time Constraint

By running life tests at higher stress levels than normal operating conditions, accelerated life testing (ALT) quickly yields information on the lifetime distribution of a test unit. The lifetime at the design stress is then estimated through extrapolation using a regression model. In constant‐stress testing, a unit is tested at a fixed stress level until failure or the termination time point of test, whereas step‐stress testing allows the experimenter to gradually increase the stress levels at some prefixed time points during the test. In this work, the optimal k‐level constant‐stress and step‐stress ALTs are compared for the exponential failure data under complete sampling and Type‐I censoring. The objective is to quantify the advantage of using the step‐stress testing relative to the constant‐stress one. Assuming a log‐linear life–stress relationship with the cumulative exposure model for the effect of changing stress in step‐stress testing, the optimal design points are determined under C/D/A‐optimality criteria. The efficiency of step‐stress testing to constant‐stress one is then discussed in terms of the ratio of optimal objective functions based on the information matrix. © 2013 Wiley Periodicals, Inc. Naval Research Logistics 00: 000–000, 2013     

加速寿命试验下复合失效产品的可靠性评估

产品往往受随机失效和耗损失效两种模式的双重影响,通过构建复合寿命分布模型来表征这类产品失效规律。在加速寿命试验下,基于极大似然估计构造了该类产品寿命参数估计的数值算法;为了验证该寿命分布是否真服从假定的复合分布,构建了常应力等效失效数据的柯尔莫哥诺夫分布检验法;最后,以电连接器这一典型产品为例进行了工程仿真试验并进行数据评估,从而验证了评估方法的正确性。