Planning accelerated life tests for censored two‐parameter exponential distributions

We consider optimal test plans involving life distributions with failure‐free life, i.e., where there is an unknown threshold parameter below which no failure will occur. These distributions do not satisfy the regularity conditions and thus the usual approach of using the Fisher information matrix to obtain an optimal accelerated life testing (ALT) plan cannot be applied. In this paper, we assume that lifetime follows a two‐parameter exponential distribution and the stress‐life relationship is given by the inverse power law model. Near‐optimal test plans for constant‐stress ALT under both failure‐censoring and time‐censoring are obtained. We first obtain unbiased estimates for the parameters and give the approximate variance of these estimates for both failure‐censored and time‐censored data. Using these results, the variance for the approximate unbiased estimate of a percentile at a design stress is computed and then minimized to produce the near‐optimal plan. Finally, a numerical example is presented together with simulation results to study the accuracy of the approximate variance given by the proposed plan and show that it outperforms the equal‐allocation plan. © 1999 John Wiley & Sons, Inc. Naval Research Logistics 46: 169–186, 1999     

Optimum step‐stress accelerated life test plans for log‐location‐scale distributions

This article presents new tools and methods for finding optimum step‐stress accelerated life test plans. First, we present an approach to calculate the large‐sample approximate variance of the maximum likelihood estimator of a quantile of the failure time distribution at use conditions from a step‐stress accelerated life test. The approach allows for multistep stress changes and censoring for general log‐location‐scale distributions based on a cumulative exposure model. As an application of this approach, the optimum variance is studied as a function of shape parameter for both Weibull and lognormal distributions. Graphical comparisons among test plans using step‐up, step‐down, and constant‐stress patterns are also presented. The results show that depending on the values of the model parameters and quantile of interest, each of the three test plans can be preferable in terms of optimum variance. © 2008 Wiley Periodicals, Inc. Naval Research Logistics, 2008     

Equivalent accelerated life testing plans for log‐location‐scale distributions

Accelerated life testing (ALT) is widely used to determine the failure time distribution of a product and the associated life‐stress relationship in order to predict the product's reliability under normal operating conditions. Many types of stress loadings such as constant‐stress, step‐stress and cyclic‐stress can be utilized when conducting ALT. Extensive research has been conducted on the analysis of ALT data obtained under a specified stress loading. However, the equivalency of ALT experiments involving different stress loadings has not been investigated. In this article, a log‐location‐scale distribution under Type I censoring is considered in planning ALT. An idea is provided for the equivalency of various ALT plans involving different stress loadings. Based on this idea, general equivalent ALT plans and some special types of equivalent ALT plans are explored. For demonstration, a constant‐stress ALT and a ramp‐stress ALT for miniature lamps are presented and their equivalency is investigated. © 2010 Wiley Periodicals, Inc. Naval Research Logistics, 2010     

Design of accelerated life testing plans under multiple stresses

Accelerated life testing (ALT) using multiple stresses is commonly used in practice to resemble the operating stresses at normal operating conditions and obtain failure observations in a much shorter time. However, to date, there is little research into the theory of planning ALT for reliability estimation with multiple stresses. ALT with multiple stresses can result in a large number of stress‐level combinations which presents a challenge for implementation. In this article, we propose an approach for the design of ALT plans with multiple stresses and formulate multistress test plans based on different objectives and practical constraints. We develop a simulated annealing algorithm to efficiently determine the testing plan parameters. We demonstrate the proposed method with examples based on an actual test conducted using three stress types. The obtained optimal test plans are compared with those based on fractional factorial design. © 2013 Wiley Periodicals, Inc. Naval Research Logistics 60: 468–478, 2013     

Statistical equivalency and optimality of simple step‐stress accelerated test plans for the exponential distribution

Accelerated life testing (ALT) is commonly used to obtain reliability information about a product in a timely manner. Several stress loading designs have been proposed and recent research interests have emerged concerning the development of equivalent ALT plans. Step‐stress ALT (SSALT) is one of the most commonly used stress loadings because it usually shortens the test duration and reduces the number of required test units. This article considers two fundamental questions when designing a SSALT and provides formal proofs in answer to each. Namely: (1) can a simple SSALT be designed so that it is equivalent to other stress loading designs? (2) when optimizing a multilevel SSALT, does it degenerate to a simple SSALT plan? The answers to both queries, under certain reasonable model assumptions, are shown to be a qualified YES. In addition, we provide an argument to support the rationale of a common practice in designing a SSALT, that is, setting the higher stress level as high as possible in a SSALT plan. © 2012 Wiley Periodicals, Inc. Naval Research Logistics, 2013     

A general model for accelerated life testing with time‐dependent covariates

This paper introduces a general or “distribution‐free” model to analyze the lifetime of components under accelerated life testing. Unlike the accelerated failure time (AFT) models, the proposed model shares the advantage of being “distribution‐free” with the proportional hazard (PH) model and overcomes the deficiency of the PH model not allowing survival curves corresponding to different values of a covariate to cross. In this research, we extend and modify the extended hazard regression (EHR) model using the partial likelihood function to analyze failure data with time‐dependent covariates. The new model can be easily adopted to create an accelerated life testing model with different types of stress loading. For example, stress loading in accelerated life testing can be a step function, cyclic, or linear function with time. These types of stress loadings reduce the testing time and increase the number of failures of components under test. The proposed EHR model with time‐dependent covariates which incorporates multiple stress loadings requires further verification. Therefore, we conduct an accelerated life test in the laboratory by subjecting components to time‐dependent stresses, and we compare the reliability estimation based on the developed model with that obtained from experimental results. The combination of the theoretical development of the accelerated life testing model verified by laboratory experiments offers a unique perspective to reliability model building and verification. © 1999 John Wiley & Sons, Inc. Naval Research Logistics 46: 303–321, 1999     

Optimal sample size allocation for tests with multiple levels of stress with extreme value regression

In this article, we discuss the optimal allocation problem in a multiple stress levels life‐testing experiment when an extreme value regression model is used for statistical analysis. We derive the maximum likelihood estimators, the Fisher information, and the asymptotic variance–covariance matrix of the maximum likelihood estimators. Three optimality criteria are defined and the optimal allocation of units for two‐ and k‐stress level situations are determined. We demonstrate the efficiency of the optimal allocation of units in a multiple stress levels life‐testing experiment by using real experimental situations discussed earlier by McCool and Nelson and Meeker. Monte Carlo simulations are used to show that the optimality results hold for small sample sizes as well. © 2006 Wiley Periodicals, Inc. Naval Research Logistics, 2007     

Determination of burn‐in parameters and residual life for highly reliable products

Today, many products are designed and manufactured to function for a long period of time before they fail. Determining product reliability is a great challenge to manufacturers of highly reliable products with only a relatively short period of time available for internal life testing. In particular, it may be difficult to determine optimal burn‐in parameters and characterize the residual life distribution. A promising alternative is to use data on a quality characteristic (QC) whose degradation over time can be related to product failure. Typically, product failure corresponds to the first passage time of the degradation path beyond a critical value. If degradation paths can be modeled properly, one can predict failure time and determine the life distribution without actually observing failures. In this paper, we first use a Wiener process to describe the continuous degradation path of the quality characteristic of the product. A Wiener process allows nonconstant variance and nonzero correlation among data collected at different time points. We propose a decision rule for classifying a unit as normal or weak, and give an economic model for determining the optimal termination time and other parameters of a burn‐in test. Next, we propose a method for assessing the product's lifetime distribution of the passed units. The proposed methodologies are all based only on the product's initial observed degradation data. Finally, an example of an electronic product, namely contact image scanner (CIS), is used to illustrate the proposed procedure. © 2002 Wiley Periodicals, Inc. Naval Research Logistics, 2003     

A model for step‐stress accelerated life testing

Modern technology is producing high reliability products. Life testing for such products under normal use condition takes a lot of time to obtain a reasonable number of failures. In this situation a step‐stress procedure is preferred for accelerated life testing. In this paper we assume a Weibull and Lognormal model whose scale parameter depends upon the present level as well as the age at the entry in the present stress level. On the basis of that we propose a parametric model to the life distribution for step‐stress testing and suggest a suitable design to estimate the parameters involved in the model. A simulation study has been done by the proposed model based on maximum likelihood estimation. © 2003 Wiley Periodicals, Inc. Naval Research Logistics, 2003     

Development programs for one‐shot systems using multiple‐state design reliability models

Design reliability at the beginning of a product development program is typically low, and development costs can account for a large proportion of total product cost. We consider how to conduct development programs (series of tests and redesigns) for one‐shot systems (which are destroyed at first use or during testing). In rough terms, our aim is to both achieve high final design reliability and spend as little of a fixed budget as possible on development. We employ multiple‐state reliability models. Dynamic programming is used to identify a best test‐and‐redesign strategy and is shown to be presently computationally feasible for at least 5‐state models. Our analysis is flexible enough to allow for the accelerated stress testing needed in the case of ultra‐high reliability requirements, where testing otherwise provides little information on design reliability change. © 2004 Wiley Periodicals, Inc. Naval Research Logistics, 2004     

Stage life testing

In progressive censoring, items are removed at certain times during the life test. Commonly, it is assumed that the removed items are used for further testing. In order to take into account information about these additional testing in inferential procedures, we propose a two‐step model of stage life testing with one fixed stage‐change time which incorporates information about both the removed items (further tested under different conditions) and those remaining in the current life test. We show that some marginal distributions in our model correspond either to progressive censoring with a fixed censoring time or to a simple‐step stress model. Furthermore, assuming a cumulative exposure model, we establish exact inferential results for the distribution parameters when the lifetimes are exponentially distributed. An extension to Weibull distributed lifetimes is also discussed.     

Due‐window assignment with unit processing‐time jobs

In due‐window assignment problems, jobs completed within a designated time interval are regarded as being on time, whereas early and tardy jobs are penalized. The objective is to determine the location and size of the due‐window, as well as the job schedule. We address a common due‐window assignment problem on parallel identical machines with unit processing time jobs. We show that the number of candidate values for the optimal due‐window starting time and for the optimal due‐window completion time are bounded by 2. We also prove that the starting time of the first job on each of the machines is either 0 or 1, thus introducing a fairly simple, constant‐time solution for the problem. © 2004 Wiley Periodicals, Inc. Naval Research Logistics, 2004     

一种新的Weibull分布恒定应力加速寿命试验分析方法

分析了Weibull分布恒定应力加速寿命试验常用的二步分析方法存在的不足 ,建立了一种新的构造数据分析方法。考虑到分布参数的相关性 ,该方法引入了Weibull分布特征寿命参数的二次估计 ,在模型拟合优度上高于原来的二步分析方法 ,使分析精度得到了改善。同时 ,该方法避免了原来二步分析方法的查表过程 ,便于软件实现和工程实际应用。     

残差GM（1，1）模型在恒加试验中的应用

介绍了目前恒加试验中,正常应力水平下特征寿命点估计的数据统计分析方法及其不足。针对恒加试验的特点和所需解决的问题,基于灰色预测理论的残差GM(1,1)模型,给出了一种新的求解方法。最后分别运用三种不同的方法对给出的应用实例进行正常应力水平下特征寿命值的求解,证明了本文所给出的方法确实可行。     

Optimal design of accelerated life testing plans for periodical replacement with penalty

Accelerated life testing (ALT), enhanced by optimal test plans, has been widely accepted in practice as a quick approach for estimating the reliability of a product. From the estimation result, preventive maintenance schedules can be determined to ensure the performance of the product under its normal operating conditions. By default, maintenance decision‐making is regarded as the last and least rewarding step. However, sometimes the maintenance schedules, such as preventive maintenance intervals, are predetermined due to customer concerns and/or by various mandatory regulations and rules. Under such circumstances, how to accurately estimate the expenditure (e.g., on maintenance or spare parts management) associated with these maintenance requirements becomes an important issue. A viable solution is to incorporate the maintenance requirements into ALT plans. This paper provides an approach for the optimal design of ALT plans oriented by a mandatory periodical replacement schedule subject to a discounted penalty. The objective is to improve the estimation accuracy of the economic impact of this maintenance requirement. A numerical experiment is provided to demonstrate the approach in practical use. © 2008 Wiley Periodicals, Inc. Naval Research Logistics 2009     

Inequality‐based reliability estimates for complex systems

Full‐system testing for large‐scale systems is often infeasible or very costly. Thus, when estimating system reliability, it is desirable to use a method that uses subsystem tests, which are often less expensive and more feasible. This article presents a method for bounding full‐system reliabilities based on subsystem tests and, if available, full‐system tests. The method does not require that subsystems be independent. It accounts for dependencies through the use of certain probability inequalities. The inequalities provide the basis for valid reliability calculations while not requiring independent subsystems or full‐system tests. The inequalities allow for test information on pairwise subsystem failure modes to be incorporated, thereby improving the bound on system reliability. We illustrate some of the properties of the estimates via an example application. © 2013 Wiley Periodicals, Inc. Naval Research Logistics, 2013     

A dynamic model for component testing

We consider the component testing problem of a system where the main feature is that the component failure rates are not constant parameters, but they change in a dynamic fashion with respect to time. More precisely, each component has a piecewise-constant failure-rate function such that the lifetime distribution is exponential with a constant rate over local intervals of time within the overall mission time. There are several such intervals, and the rates change dynamically from one interval to another. We note that these lifetime distributions can also be used in a more general setting to approximate arbitrary lifetime distributions. The optimal component testing problem is formulated as a semi-infinite linear program. We present an algorithmic procedure to compute optimal test times based on the column-generation technique and illustrate it with a numerical example. © 1997 John Wiley & Sons, Inc. Naval Research Logistics 44: 187–197, 1997     

Bounding the optimal burn‐in time for a system with two types of failure

Burn‐in is a widely used method to improve the quality of products or systems after they have been produced. In this paper, we consider the problem of determining bounds to the optimal burn‐in time and optimal replacement policy maximizing the steady state availability of a repairable system. It is assumed that two types of system failures may occur: One is Type I failure (minor failure), which can be removed by a minimal repair, and the other is Type II failure (catastrophic failure), which can be removed only by a complete repair. Assuming that the underlying lifetime distribution of the system has a bathtub‐shaped failure rate function, upper and lower bounds for the optimal burn‐in time are provided. Furthermore, some other applications of optimal burn‐in are also considered. © 2004 Wiley Periodicals, Inc. Naval Research Logistics, 2004     

On optimal system designs in reliability‐economics frameworks

Reliability Economics is a field that can be defined as the collection of all problems in which there is tension between the performance of systems of interest and their cost. Given such a problem, the aim is to resolve the tension through an optimization process that identifies the system which maximizes some appropriate criterion function (e.g. expected lifetime per unit cost). In this paper, we focus on coherent systems of n independent and identically distributed (iid) components and mixtures thereof, and characterize both a system's performance and cost as functions of the system's signature vector (Samaniego, IEEE Trans Reliabil (1985) 69–72). For a given family of criterion functions, a variety of optimality results are obtained for systems of arbitrary order n. Approximations are developed and justified when the underlying component distribution is unknown. Assuming the availability of an auxiliary sample of N component failure times, the asymptotic theory of L‐estimators is adapted for the purpose of establishing the consistency and asymptotic normality of the proposed estimators of the expected ordered failure times of the n components of the systems under study. These results lead to the identification of ε‐optimal systems relative to the chosen criterion function. © 2007 Wiley Periodicals, Inc. Naval Research Logistics, 2007     

基于步进加速寿命试验的制导弹药储存寿命评估

介绍步进应力加速寿命试验原理,通过对制导弹药自动导引头贮存状态和失效机理的分析,确定了加速寿命试验应力和应力水平．假设产品寿命服从威布尔分布,应用极大似然估计和Bayes的方法处理数据,建立制导弹药可靠储存寿命预测模型,并计算得到自动导引头在正常应力水平下的可靠储存寿命．