Global planning of accelerated degradation tests based on exponential dispersion degradation models

The accelerated degradation test (ADT) is an efficient tool for assessing the lifetime information of highly reliable products. However, conducting an ADT is very expensive. Therefore, how to conduct a cost-constrained ADT plan is a great challenging issue for reliability analysts. By taking the experimental cost into consideration, this paper proposes a semi-analytical procedure to determine the total sample size, testing stress levels, the measurement frequencies, and the number of measurements (within a degradation path) globally under a class of exponential dispersion degradation models. The proposed method is also extended to determine the global planning of a three-level compromise plan. The advantage of the proposed method not only provides better design insights for conducting an ADT plan, but also provides an efficient algorithm to obtain a cost-constrained ADT plan, compared with conventional optimal plans by grid search algorithms.     

含卤电线电缆热解卤酸气体逸出规律研究

利用热分析手段和卤酸气体选出装置对含卤电线电缆热解时的卤酸气体逸出规律进行了研究。结果表明，含卤电缆在热解过程中卤酸气体的选出量受温度的影响显著。铜芯、铝芯对电线绝缘层热解有影响。含铜芯或铝芯线料热解时的卤酸气体逸出量比电线净绝缘层的少。随着氧含量的增加，卤酸气体逸出量几乎成线性增加。     

微波辐射Fenton反应降解罗丹明B研究

Fenton试剂在降解有机污染物方面具有无二次污染等优势，但由于存在降解速率较慢的缺陷，在工程实践中尚未得以推广应用。考虑到微波具有促进有机化学反应速率的功能，采用微波和Fenton试剂联合作用氧化降解罗丹明B，对降解罗丹明B的优化实验条件进行了研究。首先研究了单一因素对降解效果的影响，然后对各种因素的综合作用效果进行了分析，得出了降解的优化实验条件。研究表明，微波能有效促进罗丹明B的降解脱色，而且能大大缩短反应时间，降低反应成本，增强Fenton氧化反应的活性，提高降解效果。     

基于观测预测粒子滤波的雷达组网目标状态估计

雷达组网系统跟踪目标时,观测数据与目标跟踪状态成严重非线性关系,难以用卡尔曼滤波最优估计方法,处理非高斯非线性系统滤波估计问题的粒子滤波算法容易产生粒子退化问题。因此,使用观测预测粒子滤波算法解决这个问题,该算法基于观测似然进行重要性采样,结合一步预测信息计算粒子权值,保证了采样粒子处于高观测似然区,并充分利用了一步预测信息。仿真验证表明,将观测预测粒子滤波算法应用于目标状态估计,避免了粒子退化,收敛快,估计精度高。     

在非高斯弱相关噪声中弱信号的最佳检测

本文探讨了仅已知噪声一维分布和二阶统计特性的条件下非高斯无穷相关噪声中确知弱信号的最佳检测问题。在假设噪声为一阶AR过程ni=yi+ρn(i-l)的情况下,以最优化检测器的渐近相对效验为准则。并对p取一阶和二阶近似的意义下,分别得到了最佳有记忆和无记忆检测器的闭式解。推证和比较了它们同非高斯白噪声中的最佳检测器在结构上的异同和性能上的改进程度。最后给出了几个典型的实际例子。     

Life distribution analysis based on Lévy subordinators for degradation with random jumps

For a component or a system subject to stochastic degradation with sporadic jumps that occur at random times and have random sizes, we propose to model the cumulative degradation with random jumps using a single stochastic process based on the characteristics of Lévy subordinators, the class of nondecreasing Lévy processes. Based on the inverse Fourier transform, we derive a new closed‐form reliability function and probability density function for lifetime, represented by Lévy measures. The reliability function derived using the traditional convolution approach for common stochastic models such as gamma degradation process with random jumps, is revealed to be a special case of our general model. Numerical experiments are used to demonstrate that our model performs well for different applications, when compared with the traditional convolution method. More importantly, it is a general and useful tool for life distribution analysis of stochastic degradation with random jumps in multidimensional cases. © 2015 Wiley Periodicals, Inc. Naval Research Logistics 62: 483–492, 2015     

Optimal inventory control policy for periodic‐review inventory systems with inventory‐level‐dependent demand

We consider a setting in which inventory plays both promotional and service roles; that is, higher inventories not only improve service levels but also stimulate demand by serving as a promotional tool (e.g., as the result of advertising effect by the enhanced product visibility). Specifically, we study the periodic‐review inventory systems in which the demand in each period is uncertain but increases with the inventory level. We investigate the multiperiod model with normal and expediting orders in each period, that is, any shortage will be met through emergency replenishment. Such a model takes the lost sales model as a special case. For the cases without and with fixed order costs, the optimal inventory replenishment policy is shown to be of the base‐stock type and of the (s,S) type, respectively. © 2012 Wiley Periodicals, Inc. Naval Research Logistics, 2012     

Sequential and systematic sampling plans for the Markov‐dependent production process

Acceptance sampling plans are used to assess the quality of an ongoing production process, in addition to the lot acceptance. In this paper, we consider sampling inspection plans for monitoring the Markov‐dependent production process. We construct sequential plans that satisfy the usual probability requirements at acceptable quality level and rejectable quality level and, in addition, possess the minimum average sample number under semicurtailed inspection. As these plans result in large sample sizes, especially when the serial correlation is high, we suggest new plans called “systematic sampling plans.” The minimum average sample number systematic plans that satisfy the probability requirements are constructed. Our algorithm uses some simple recurrence relations to compute the required acceptance probabilities. The optimal systematic plans require much smaller sample sizes and acceptance numbers, compared to the sequential plans. However, they need larger production runs to make a decision. Tables for choosing appropriate sequential and systematic plans are provided. The problem of selecting the best systematic sampling plan is also addressed. The operating characteristic curves of some of the sequential and the systematic plans are compared, and are observed to be almost identical. © 2001 John Wiley & Sons, Inc. Naval Research Logistics 48: 451–467, 2001     

应变天平测量电路退化及失效检测技术

针对振动、温度应力等引起的风洞应变天平检测电路(惠斯登电桥)的退化或失效,提出一种检测方法。基于不同时刻在电桥不同节点施加激励并测量其响应,通过理论计算实现电桥的参数解析,基于聚类实现失效检测。研制了原理样机,并开展实验研究,实验结果表明该方法有效,可以实现电桥的失效检测,电桥电阻的测量精度可以达到0. 2‰以上。基于该方法设计的样机,可以实现应变天平检测电路的退化及失效的自动检测,节省故障诊断时间,提高风洞试验的可用时间。     

Priori information analysis of optocoupler accelerated degradation experiment based on failure mechanism verification test

The optocoupler is a weak link in the inertial navigation platform of a kind of guided munitions. It is necessary to use accelerated storage test to verify the storage life of long storage products. Especially for small sample products, it is very important to obtain prior information for the design and implementation of accelerated degradation test. In this paper, the optocoupler failure mechanism verification test is designed and the experimental results are analyzed and the prior information is obtained. The results show that optocouplers have two failure modes, one is sudden failure and the other is degradation failure; the maximum temperature stress of optocoupler can't exceed 140 °C; the increase of leakage current of optocoupler is caused by movable ions contaminating the LED chip. The surface leakage current is proportional to the adsorption amount. The increase of leakage current makes p-n junction tunneling effect occur which LEDs the failure of the optocoupler. The lifetime distribution model of the optocoupler is determined by the failure physics. The lifetime of the optocoupler is subject to the lognormal distribution. The degeneracy orbit of the optocoupler leakage current is described by a power law model. The estimated values of the orbital parameters are initially calculated and the parameters of its life distribution function are deduced. The above information lays a good foundation for the optimization design and data processing of the accelerated degradation experiment.