发变电所传导干扰分析与抑制措施的研究

通过对发变电所由开关操作在二次系统和低压交流电源系统传导测量结果的分析，确定变电站低压交流电源中传导干扰的特征，利用安捷伦（Agilent）矢量网络分析仪，研究几种典型电源滤波器的插入损耗和特性阻抗等频率特性，应用夏弗纳（Schaffner）等系列抗扰度试验设备，研究电源滤波器对电快速瞬变脉冲群和衰减振荡波的滤波和抑制效果，给出了变电站电源滤波器的滤波特性要求。     

基于PXI的舰炮电气设备通用自动测试系统

采用虚拟仪器技术,并通过软件产生模拟信号拉制设备的运转,完成动态信号的提取,实现电气设备测试系统的研制.该系统具有通用性、高效性和易用性等特点,具有较好的实用价值.     

C~3I系统试验评估方法

C3I系统试验评估是C3I系统外场试验中非常重要的一个环节.结合C3I系统外场试验的试验需求,建立了一套相对比较完整的、包含了C3I系统评估方法、评估指标体系和指标计算模型三要素在内的C3I系统试验评估体系.利用模糊的概念和变权评估方法,改进了传统的层次分析法,提出了一种变权模糊层次分析法作为C3I系统评估方法.最后,通过某防空情报指挥系统外场试验评估实例验证了该评估体系的正确性和科学性.所设计的C3I系统试验评估体系技术先进、科学实用,对C3I系统外场试验鉴定具有比较重要的指导意义.     

C~4ISR系统仿真测试研究

针对一种C4ISR系统在测试时的特点,提出了模拟仿真测试的方案,建立了仿真装备与指挥系统的交互模型,设计了交互对象的自动匹配算法,并在实际系统的仿真测试中得到应用和验证。     

核动力装置一回路辅助系统失水事故的仿真研究

运用一种操作简便、计算速度快的工具软件对某核动力装置一回路辅助系统典型位置的失水事故进行了仿真.通过分析仿真结果得出不同位置的破口引起不同后果的事故,其中有些事故可以忽略,有些事故则相当严重.     

电子时间引信检测仿真试验研究

为提高电子时间引信的检测能力，介绍了电子时间引信检测仿真试验，分析了仿真试验的原理，给出了检测仿真试验的试验方法。经实际检测表明，该检测仿真试验能够安全可靠地完成电子时间引信的日常检测任务。     

Determination of burn‐in parameters and residual life for highly reliable products

Today, many products are designed and manufactured to function for a long period of time before they fail. Determining product reliability is a great challenge to manufacturers of highly reliable products with only a relatively short period of time available for internal life testing. In particular, it may be difficult to determine optimal burn‐in parameters and characterize the residual life distribution. A promising alternative is to use data on a quality characteristic (QC) whose degradation over time can be related to product failure. Typically, product failure corresponds to the first passage time of the degradation path beyond a critical value. If degradation paths can be modeled properly, one can predict failure time and determine the life distribution without actually observing failures. In this paper, we first use a Wiener process to describe the continuous degradation path of the quality characteristic of the product. A Wiener process allows nonconstant variance and nonzero correlation among data collected at different time points. We propose a decision rule for classifying a unit as normal or weak, and give an economic model for determining the optimal termination time and other parameters of a burn‐in test. Next, we propose a method for assessing the product's lifetime distribution of the passed units. The proposed methodologies are all based only on the product's initial observed degradation data. Finally, an example of an electronic product, namely contact image scanner (CIS), is used to illustrate the proposed procedure. © 2002 Wiley Periodicals, Inc. Naval Research Logistics, 2003     

改进的Euler方法应用于非线性方程求根

本文通过引入动力系统，将改进的Euler方法应用于非线性方程求根问题，给出非线性方程求根的预估-再校正迭代格式，证明了该格式至少二阶收敛并可以调节参数达到超收敛。最后给出数值实验，数值结果验证了算法的有效性。     

Estimating failure time distribution and its parameters based on intermediate data from a Wiener degradation model

Instead of measuring a Wiener degradation or performance process at predetermined time points to track degradation or performance of a product for estimating its lifetime, we propose to obtain the first‐passage times of the process over certain nonfailure thresholds. Based on only these intermediate data, we obtain the uniformly minimum variance unbiased estimator and uniformly most accurate confidence interval for the mean lifetime. For estimating the lifetime distribution function, we propose a modified maximum likelihood estimator and a new estimator and prove that, by increasing the sample size of the intermediate data, these estimators and the above‐mentioned estimator of the mean lifetime can achieve the same levels of accuracy as the estimators assuming one has failure times. Thus, our method of using only intermediate data is useful for highly reliable products when their failure times are difficult to obtain. Furthermore, we show that the proposed new estimator of the lifetime distribution function is more accurate than the standard and modified maximum likelihood estimators. We also obtain approximate confidence intervals for the lifetime distribution function and its percentiles. Finally, we use light‐emitting diodes as an example to illustrate our method and demonstrate how to validate the Wiener assumption during the testing. © 2008 Wiley Periodicals, Inc. Naval Research Logistics, 2008