基于似然比检验的橡胶密封件加速试验机理一致性判别方法

加速退化试验广泛应用于橡胶密封件等长寿命产品的可靠性评估，试验过程中需要将高应力水平下的试验结果外推到正常应力水平。要获得准确的产品可靠性评估结果，需要保证加速应力下的退化失效机理与正常应力下的退化失效机理一致。基于似然比检验原理，提出加速退化试验机理一致性判别方法及流程。针对失效机理一致与失效机理变化两种场合，提出对数线性及非对数线性两类加速模型，并结合混合效应模型描述产品退化过程。利用似然比检验判断加速模型参数是否变化，完成失效机理一致性判别。仿真算例和应用实例表明，该方法能够有效判别橡胶密封件失效机理是否变化，并找到失效机理不变的应力水平边界。     

Optimal accelerated life test designs for Burr type XII distributions under periodic inspection and type I censoring

This article develops optimal accelerated life test designs for Burr Type XII distributions under periodic inspection and Type I censoring. It is assumed that the mean lifetime (the Burr XII scale parameter) is a log-linear function of stress and that the shape parameters are independent of stress. For given shape parameters, design stress and high test stress, the test design is optimized with respect to the low test stress and the proportion of test units allocated to the low stress. The optimality criterion is the asymptotic variance of the maximum-likelihood estimator of log mean life at the design stress with the use of equally spaced inspection times. Computational results for various values of the shape parameters show that this criterion is insensitive to the number of inspection times and to misspecification of imputed failure probabilities at the design and high test stresses. Procedures for planning an accelerated life test, including selection of sample size, are also discussed. It is shown that optimal designs previously obtained for exponential and Weibull distributions are similar to those obtained here for the appropriate special cases of the Burr XII distribution. Thus the Burr XII distribution is a useful and widely applicable family of reliability models for ALT design. © 1996 John Wiley & Sons, Inc.     

Sensitivity Test and Data Analysis for Storage Reliability Assessment of Explosive Initiator

The explosive initiator is one kind of sensitivity products with long life and high reliability.In order to improve the storage reliability assessment,the method of storage reliability assessment for explosive initiator was proposed based on time series model using the sensitivity test data.In the method,the up and down test was used to estimate the distribution parameters of threshold.And an approach to design the up and down test was present to draw better estimations.Furthermore,the method of shrinkage estimation was introduced to get a better estimation of scale parameter by combining the sample information with prior information.The simulation result shows that the shrinkage estimation is better than traditional estimation under certain conditions.With the distribution parameters estimations,the time series models were used to describe the changing trends of distribution parameters along with storage time.Then for a fixed storage time,the distribution parameters were predicted based on the models.Finally,the confidence interval of storage reliability was obtained by fiducial inference.The illustrative example shows that the method is available for storage reliability assessment of the explosive initiator with high reliability.     

加速寿命试验下复合失效产品的可靠性评估

产品往往受随机失效和耗损失效两种模式的双重影响,通过构建复合寿命分布模型来表征这类产品失效规律。在加速寿命试验下,基于极大似然估计构造了该类产品寿命参数估计的数值算法;为了验证该寿命分布是否真服从假定的复合分布,构建了常应力等效失效数据的柯尔莫哥诺夫分布检验法;最后,以电连接器这一典型产品为例进行了工程仿真试验并进行数据评估,从而验证了评估方法的正确性。     

基于复合失效模式的寿命分布检验方法

产品往往受随机失效和耗损失效两种模式的双重影响,因此,构造指数威布尔分布表征该类产品的失效规律。首先,用图检验法对该类产品的寿命数据进行初步检验;其次,研究了该类产品寿命数据的极大似然估计的求解方法,进一步用伽方检验方法对寿命分布类进行了检验;最后,通过工程仿真例子说明了该方法的具体操作流程,最终验证了方法的正确性。     

Determination of burn‐in parameters and residual life for highly reliable products

Today, many products are designed and manufactured to function for a long period of time before they fail. Determining product reliability is a great challenge to manufacturers of highly reliable products with only a relatively short period of time available for internal life testing. In particular, it may be difficult to determine optimal burn‐in parameters and characterize the residual life distribution. A promising alternative is to use data on a quality characteristic (QC) whose degradation over time can be related to product failure. Typically, product failure corresponds to the first passage time of the degradation path beyond a critical value. If degradation paths can be modeled properly, one can predict failure time and determine the life distribution without actually observing failures. In this paper, we first use a Wiener process to describe the continuous degradation path of the quality characteristic of the product. A Wiener process allows nonconstant variance and nonzero correlation among data collected at different time points. We propose a decision rule for classifying a unit as normal or weak, and give an economic model for determining the optimal termination time and other parameters of a burn‐in test. Next, we propose a method for assessing the product's lifetime distribution of the passed units. The proposed methodologies are all based only on the product's initial observed degradation data. Finally, an example of an electronic product, namely contact image scanner (CIS), is used to illustrate the proposed procedure. © 2002 Wiley Periodicals, Inc. Naval Research Logistics, 2003     

Comparison between constant‐stress and step‐stress accelerated life tests under Time Constraint

By running life tests at higher stress levels than normal operating conditions, accelerated life testing (ALT) quickly yields information on the lifetime distribution of a test unit. The lifetime at the design stress is then estimated through extrapolation using a regression model. In constant‐stress testing, a unit is tested at a fixed stress level until failure or the termination time point of test, whereas step‐stress testing allows the experimenter to gradually increase the stress levels at some prefixed time points during the test. In this work, the optimal k‐level constant‐stress and step‐stress ALTs are compared for the exponential failure data under complete sampling and Type‐I censoring. The objective is to quantify the advantage of using the step‐stress testing relative to the constant‐stress one. Assuming a log‐linear life–stress relationship with the cumulative exposure model for the effect of changing stress in step‐stress testing, the optimal design points are determined under C/D/A‐optimality criteria. The efficiency of step‐stress testing to constant‐stress one is then discussed in terms of the ratio of optimal objective functions based on the information matrix. © 2013 Wiley Periodicals, Inc. Naval Research Logistics 00: 000–000, 2013     

Planning accelerated life tests for censored two‐parameter exponential distributions

We consider optimal test plans involving life distributions with failure‐free life, i.e., where there is an unknown threshold parameter below which no failure will occur. These distributions do not satisfy the regularity conditions and thus the usual approach of using the Fisher information matrix to obtain an optimal accelerated life testing (ALT) plan cannot be applied. In this paper, we assume that lifetime follows a two‐parameter exponential distribution and the stress‐life relationship is given by the inverse power law model. Near‐optimal test plans for constant‐stress ALT under both failure‐censoring and time‐censoring are obtained. We first obtain unbiased estimates for the parameters and give the approximate variance of these estimates for both failure‐censored and time‐censored data. Using these results, the variance for the approximate unbiased estimate of a percentile at a design stress is computed and then minimized to produce the near‐optimal plan. Finally, a numerical example is presented together with simulation results to study the accuracy of the approximate variance given by the proposed plan and show that it outperforms the equal‐allocation plan. © 1999 John Wiley & Sons, Inc. Naval Research Logistics 46: 169–186, 1999     

Global planning of accelerated degradation tests based on exponential dispersion degradation models

The accelerated degradation test (ADT) is an efficient tool for assessing the lifetime information of highly reliable products. However, conducting an ADT is very expensive. Therefore, how to conduct a cost-constrained ADT plan is a great challenging issue for reliability analysts. By taking the experimental cost into consideration, this paper proposes a semi-analytical procedure to determine the total sample size, testing stress levels, the measurement frequencies, and the number of measurements (within a degradation path) globally under a class of exponential dispersion degradation models. The proposed method is also extended to determine the global planning of a three-level compromise plan. The advantage of the proposed method not only provides better design insights for conducting an ADT plan, but also provides an efficient algorithm to obtain a cost-constrained ADT plan, compared with conventional optimal plans by grid search algorithms.     

步进加速退化试验及其在电子产品可靠性评估中的应用

为快速评估具有高可靠、长寿命特点的电子产品的可靠性，提出了使用步进加速退化试验技术的方法。文中首先给出了步进加速退化的试验方法及基本假设，然后给出了步进退化数据向恒加退化数据的折算方法，在此基础上提出了基于伪失效寿命的步进加速退化可靠性评估算法，最后利用试验数据对该方法进行了验证。该方法与恒加退化试验相比，在保持样本量不变的基础上，可以极大地缩短试验时间，因此，具有更高的效费比。     

A general model for accelerated life testing with time‐dependent covariates

This paper introduces a general or “distribution‐free” model to analyze the lifetime of components under accelerated life testing. Unlike the accelerated failure time (AFT) models, the proposed model shares the advantage of being “distribution‐free” with the proportional hazard (PH) model and overcomes the deficiency of the PH model not allowing survival curves corresponding to different values of a covariate to cross. In this research, we extend and modify the extended hazard regression (EHR) model using the partial likelihood function to analyze failure data with time‐dependent covariates. The new model can be easily adopted to create an accelerated life testing model with different types of stress loading. For example, stress loading in accelerated life testing can be a step function, cyclic, or linear function with time. These types of stress loadings reduce the testing time and increase the number of failures of components under test. The proposed EHR model with time‐dependent covariates which incorporates multiple stress loadings requires further verification. Therefore, we conduct an accelerated life test in the laboratory by subjecting components to time‐dependent stresses, and we compare the reliability estimation based on the developed model with that obtained from experimental results. The combination of the theoretical development of the accelerated life testing model verified by laboratory experiments offers a unique perspective to reliability model building and verification. © 1999 John Wiley & Sons, Inc. Naval Research Logistics 46: 303–321, 1999     

基于步进加速寿命试验的制导弹药储存寿命评估

介绍步进应力加速寿命试验原理,通过对制导弹药自动导引头贮存状态和失效机理的分析,确定了加速寿命试验应力和应力水平．假设产品寿命服从威布尔分布,应用极大似然估计和Bayes的方法处理数据,建立制导弹药可靠储存寿命预测模型,并计算得到自动导引头在正常应力水平下的可靠储存寿命．     

考虑非线性退化与随机失效阈值的剩余寿命预测

针对广泛存在的非线性退化设备,现有方法尚未考虑随机失效阈值对剩余寿命预测结果的影响。因此,通过对设备性能退化过程进行分析,提出了一种综合考虑非线性退化与随机失效阈值的剩余寿命预测方法。基于Wiener过程构建了考虑个体差异与测量误差的非线性退化模型;基于卡尔曼滤波算法建立状态空间模型以实现对退化状态的在线更新;基于极大似然法估计失效阈值分布系数估计方法,得到随机失效阈值的概率分布;基于随机失效阈值推导出剩余寿命的概率分布,实现对剩余寿命的在线预测。算例研究表明,所提方法可以有效地提升剩余寿命预测的准确性,具备一定工程应用价值。     

Planning gamma accelerated degradation tests with two accelerating variables

Gamma accelerated degradation tests (ADT) are widely used to assess timely lifetime information of highly reliable products with degradation paths that follow a gamma process. In the existing literature, there is interest in addressing the problem of deciding how to conduct an efficient, ADT that includes determinations of higher stress‐testing levels and their corresponding sample‐size allocations. The existing results mainly focused on the case of a single accelerating variable. However, this may not be practical when the quality characteristics of the product have slow degradation rates. To overcome this difficulty, we propose an analytical approach to address this decision‐making problem using the case of two accelerating variables. Specifically, based on the criterion of minimizing the asymptotic variance of the estimated q quantile of lifetime distribution of the product, we analytically show that the optimal stress levels and sample‐size allocations can be simultaneously obtained via a general equivalence theorem. In addition, we use a practical example to illustrate the proposed procedure.     

Optimal design of accelerated life tests with two stresses

Most of the previous works on designing accelerated life test plans were concerned with the case where a single stress is employed for acceleration. In this article we develop optimal accelerated life test plans when two stresses are involved with possible interaction between them. The lifetimes of test items are assumed to follow an exponential distribution, the mean of which depends on the stresses according to the generalized Eyring law. A factorial arrangement of test points is considered for an efficient utilization of equipment, and the low level of each stress and the proportion of test items allocated to each test point are determined such that the asymptotic variance of the maximum-likelihood estimator of the mean lifetime at the use condition or of an acceleration factor is minimized. Patterns of optimal plans are identified and their efficiencies are compared with the corresponding single-stress accelerated life test plans. © 1996 John Wiley & Sons, Inc.     

Bayesian estimation and optimal designs in partially accelerated life testing

A method of life testing is proposed which combines both ordinary and accelerated life-testing procedures. It is assumed that an item can be tested either in a standard environment or under stress. The amount of stress is fixed in advance and is the same for all items to be tested However, the time x at which an item on lest is taken out of the standard environment and put under stress can be chosen by the experimenter subject to a given cost structure. When an item is put under stress its lifetime is changed by the factor α. Let the random variable T denote the lifetime of an item in the standard environment, and let γ denote its lifetime under the partially accelerated test procedure just described. Then Y = T if T ≦ x, and Y = x + α (T > x) if T > x. It is assumed that T has an exponential distribution with parameter θ. The estimation of θ and α and the optimal design of a partially accelerated life test are studied in the framework of Bayesian decision theory.     

Estimating failure time distribution and its parameters based on intermediate data from a Wiener degradation model

Instead of measuring a Wiener degradation or performance process at predetermined time points to track degradation or performance of a product for estimating its lifetime, we propose to obtain the first‐passage times of the process over certain nonfailure thresholds. Based on only these intermediate data, we obtain the uniformly minimum variance unbiased estimator and uniformly most accurate confidence interval for the mean lifetime. For estimating the lifetime distribution function, we propose a modified maximum likelihood estimator and a new estimator and prove that, by increasing the sample size of the intermediate data, these estimators and the above‐mentioned estimator of the mean lifetime can achieve the same levels of accuracy as the estimators assuming one has failure times. Thus, our method of using only intermediate data is useful for highly reliable products when their failure times are difficult to obtain. Furthermore, we show that the proposed new estimator of the lifetime distribution function is more accurate than the standard and modified maximum likelihood estimators. We also obtain approximate confidence intervals for the lifetime distribution function and its percentiles. Finally, we use light‐emitting diodes as an example to illustrate our method and demonstrate how to validate the Wiener assumption during the testing. © 2008 Wiley Periodicals, Inc. Naval Research Logistics, 2008     

Designing a degradation experiment

Degradation experiments are widely used to assess the reliability of highly reliable products which are not likely to fail under the traditional life tests. In order to conduct a degradation experiment efficiently, several factors, such as the inspection frequency, the sample size, and the termination time, need to be considered carefully. These factors not only affect the experimental cost, but also affect the precision of the estimate of a product's lifetime. In this paper, we deal with the optimal design of a degradation experiment. Under the constraint that the total experimental cost does not exceed a predetermined budget, the optimal decision variables are solved by minimizing the variance of the estimated 100pth percentile of the lifetime distribution of the product. An example is provided to illustrate the proposed method. Finally, a simulation study is conducted to investigate the robustness of this proposed method. © 1999 John Wiley & Sons, Inc. Naval Research Logistics 46: 689–706, 1999     

Optimum step‐stress accelerated life test plans for log‐location‐scale distributions

This article presents new tools and methods for finding optimum step‐stress accelerated life test plans. First, we present an approach to calculate the large‐sample approximate variance of the maximum likelihood estimator of a quantile of the failure time distribution at use conditions from a step‐stress accelerated life test. The approach allows for multistep stress changes and censoring for general log‐location‐scale distributions based on a cumulative exposure model. As an application of this approach, the optimum variance is studied as a function of shape parameter for both Weibull and lognormal distributions. Graphical comparisons among test plans using step‐up, step‐down, and constant‐stress patterns are also presented. The results show that depending on the values of the model parameters and quantile of interest, each of the three test plans can be preferable in terms of optimum variance. © 2008 Wiley Periodicals, Inc. Naval Research Logistics, 2008     

A nonparametric approach to accelerated life testing under multiple stresses

Accelerated life testing (ALT) is concerned with subjecting items to a series of stresses at several levels higher than those experienced under normal conditions so as to obtain the lifetime distribution of items under normal levels. A parametric approach to this problem requires two assumptions. First, the lifetime of an item is assumed to have the same distribution under all stress levels, that is, a change of stress level does not change the shape of the life distribution but changes only its scale. Second, a functional relationship is assumed between the parameters of the life distribution and the accelerating stresses. A nonparametric approach, on the other hand, assumes a functional relationship between the life distribution functions at the accelerated and nonaccelerated stress levels without making any assumptions on the forms of the distribution functions. In this paper, we treat the problem nonparametrically. In particular, we extend the methods of Shaked, Zimmer, and Ball [7] and Strelec and Viertl [8] and develop a nonparametric estimation procedure for a version of the generalized Arrhenius model with two stress variables assuming a linear acceleration function. We obtain consistent estimates as well as confidence intervals of the parameters of the life distribution under normal stress level and compare our nonparametric method with parametric methods assuming exponential, Weibull and lognormal life distributions using both real life and simulated data. © 1998 John Wiley & Sons, Inc. Naval Research Logistics 45: 629–644, 1998